2012
DOI: 10.1117/12.926819
|View full text |Cite
|
Sign up to set email alerts
|

Development of fast data processing electronics for a stacked x-ray detector system with application as a polarimeter

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
5
0

Year Published

2014
2014
2016
2016

Publication Types

Select...
1
1

Relationship

2
0

Authors

Journals

citations
Cited by 2 publications
(5 citation statements)
references
References 12 publications
0
5
0
Order By: Relevance
“…We have already described this application in Maier et al (2012) 6 for a 200 keV test beam. At this energy Si works as an effective material for Compton scattering.…”
Section: X-ray Polarimetermentioning
confidence: 98%
See 3 more Smart Citations
“…We have already described this application in Maier et al (2012) 6 for a 200 keV test beam. At this energy Si works as an effective material for Compton scattering.…”
Section: X-ray Polarimetermentioning
confidence: 98%
“…The supply voltages and electrical signals of the LED are connected to the sides, while all electrical connections of the HED are connected to the backside of the vessel. Both detectors are installed in a way, that both sensitive (5) and (6). Right: the back view of the vessel shows the LED-ADC with the D3C (5) and the HED-ADC with controlling electronics (6).…”
Section: The Mechanical Setupmentioning
confidence: 99%
See 2 more Smart Citations
“…The ECC method was tested with a 8 x 8 pixel CdTe detector Caliste 64 Meuris et al [2009b] within the detector setup CANDELA Maier et al [2012Maier et al [ , 2014.…”
Section: Applicationmentioning
confidence: 99%