Development of highly efficient, long-term reliable crystalline silicon solar cells and modules by low-cost mass production

Abstract

To reduce photovoltaic (PV) power generation costs, the reduction of PV module manufacturing costs, the improvement of cell and module efficiencies, and the long-term output power warranty of PV modules are necessary. Using the high-quality, low-cost crystal growth technology, we developed a high-quality casting process by the seed-cast method. Using a seed-cast wafer, an efficiency of 20.54% has been obtained with passivated emitter and rear cells (PERCs). The ohmic contact degradation of front electrodes and potential-induced degradation are the typical modes that significantly affect the module lifetime. Considering the field stresses induced by ultraviolet light, heat and humidity (H&H), and the electrical potential difference, sequentially combined stress tests of small modules and additional stress tests of field-aged modules are performed. The test results for the modules fabricated using our technology indicated that the modules have a sufficiently long lifetime of more than 30 years and are potential-induced degradation (PID)-free under these stresses in Japanese domestic environments.

Advancements in Photovoltaic Cell Materials: Silicon, Organic, and Perovskite Solar Cells

“…In an effort to reduce the cost of photovoltaic (PV) power generation, Irie and group [ 14 ] focused on three primary objectives: lowering the manufacturing costs of PV modules, improving the efficiencies of cells and modules, and extending the long-term output power warranty of PV modules. They developed a high-quality and cost-effective seed-cast wafer, which achieved an efficiency of 20.54% with passivated emitter and rear cells (PERCs).…”

Effect of barrier property of backsheet on degradation of crystalline silicon photovoltaic modules under combined acceleration test composed of UV irradiation and subsequent damp-heat stress

“…These multiple stresses combine and degrade PV modules. Therefore, it is necessary to design and conduct a combined acceleration test composed of these various stresses, and some acceleration tests with combined stresses such as DH and electrical stresses, 2,17) UV and DH stresses, [18][19][20][21][22][23][24] UV and thermal cycling stresses, 25,26) and multiple combined stresses [27][28][29] are studied according to the purpose of each test.…”