2018 Pan Pacific Microelectronics Symposium (Pan Pacific) 2018
DOI: 10.23919/panpacific.2018.8319010
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Development of highly reliable low temperature curable photosensitive polyimide

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“…They examined Cu atom and ion diffusion into the polyimide layer, and the void formation between Cu and polyimide mechanism. They found that the void was formed due to the diffusion-rate difference in Cu atom and Cu ion [9]. The study of the Cu-void formation is quite important for the material development.…”
Section: Masao Tomikawamentioning
confidence: 99%
“…They examined Cu atom and ion diffusion into the polyimide layer, and the void formation between Cu and polyimide mechanism. They found that the void was formed due to the diffusion-rate difference in Cu atom and Cu ion [9]. The study of the Cu-void formation is quite important for the material development.…”
Section: Masao Tomikawamentioning
confidence: 99%