Development of imaging energy analyzer using multipole Wien filter

Niimi, Hironobu; Katô, Makoto; Tsutsumi, Tetsuya; Kawasaki, Takashi; Matsudaira, Hiromichi; Suzuki, Shuichi; Chun, Wang‐Jae; Kitajima, Yoshinori; Kudo, M.; Asakura, Kiyotaka

doi:10.1016/j.apsusc.2004.09.086

Cited by 12 publications

(12 citation statements)

References 3 publications

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“…[61][62][63][64] A 200 W Hg-Xe lamp was used as excitation source. Because the work functions for Ni3P2 and Ni3P were expected at around 5.22 eV and 4.77 eV, respectively, a low pass filter was placed in front of the lamp with a cutoff energy of 5 eV to excite the surface with light less than 5 eV.…”

Section: Peemmentioning

confidence: 99%

Scanning Tunneling Microscopy and Photoemission Electron Microscopy Studies on Single Crystal Ni<SUB>2</SUB>P Surfaces

Suzuki

Moula²,

Miyamoto³

et al. 2009

J. Nanosci. Nanotech.

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The surface structures of nickel phosphide (Ni2P) single crystals were studied by scanning tunneling microscopy (STM) and photoemission electron microscopy (PEEM). Atomically resolved 1 x 1 images of the Ni2P(0001) and (1010) surfaces are successfully obtained with STM, whose respective dimensions of (0.59 nm x 0.59 nm) and (0.34 nm x 0.59 nm) match the unit cell lengths. The Ni2P(0001) surface has two possible terminations in which the Ni:P ratios are 3:1 (Ni3P termination) or 3:2 (Ni3P2 termination). In the Ni3P terminated surface the Ni atoms have a square pyramidal structure, and in the Ni3P2 terminated surface the Ni atoms have a tetrahedral structure. Only the P is visible in the STM for Ni2P(0001) and this is explained as being due to the greater extension of the phosphorus p orbitals than the Ni d orbitals at the surface. The surface domain sizes of the Ni3P and Ni3P2 termination structures of Ni2P(0001) are determined to be 500 microm by means of PEEM using a Hg-Xe lamp through a low-pass UV-filter. Evidence is found for dissociative adsorbed hydrogen on the Ni3P termination surface of Ni2P(0001), but not on the Ni3P2 surface, indicating that the square pyramidal sites on the Ni3P surface have high reactivity.

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Section: Peemmentioning

confidence: 99%

Scanning Tunneling Microscopy and Photoemission Electron Microscopy Studies on Single Crystal Ni<SUB>2</SUB>P Surfaces

Suzuki

Moula²,

Miyamoto³

et al. 2009

J. Nanosci. Nanotech.

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show abstract

“…The utilization of an in-lab X-ray source is another challenge of this field because the beam time of synchrotron radiation is limited. Some in-lab machines are now being developed using a high-intensity rotatory anode [13,19]. Such in-lab X-ray sources will make the EXPEEM method more familiar to nano-scientists and engineers.…”

Section: Future Prospectsmentioning

confidence: 99%

“…For that reason, electric discharges sometimes occurred, which corrupted the entire system. Recently, we have improved the system to include a magnetic objective lens instead of an electrostatic objective lens [18,19]. Discharges between the objective lens and the sample rarely occurred thereafter.…”

Section: Introductionmentioning

confidence: 99%

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Energy-filtered X-ray photoemission electron microscopy and its applications to surface and organic materials

Tsutsumi

Miyamoto

Niimi

et al. 2007

Solid-State Electronics

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“…36) A similar approach, using a multipole Wien filter , is now under development for PEEM . 37) Finally, the use of an electron mirror has been proposed for aberration correction in PEEM and LEEM . 38) While all conventional electron lenses have aberrations of the same sign, an electron mirror (like the multipole lenses) produces aberrations of the opposite sign and allows therefore to compensate for the aberrations of the lenses.…”

Section: ．Aberration Correctionmentioning

confidence: 99%

Nanoscale Imaging and Spectroscopy with XPEEM

Heun

2005

Journal of The Surface Science Society of Japan

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The continuous miniaturization and increasing complexity of the materials used in modern technology requires to have access to chemical composition, electronic structure, magnetization, and fluctuations in these properties at sub-micron and nanometer scales. X-ray photoemission electron microscopy (XPEEM) can provide this information. The recent years have seen a strong increase in XPEEM activities worldwide. This paper reviews the present situation and future developments of XPEEM in combination with synchrotron radiation. In particular, the role of energy filtering, aberration correction, and temporal resolution is discussed. 1．IntroductionX-ray photoelectron spectroscopy (XPS) and the related technique , X-ray absorption spectroscopy (XAS), are powerful tools for the analysis of surfaces, as widely discussed in this issue. In a traditional experimental setup, the spectroscopic signal is obtained from a spot of some 100 µm to millimeters in diameter, and therefore averages over this area. On the other hand, the progress in modern nanotechnology has fueled an evergrowing demand to perform XPS and XAS from areas as small as the smallest building blocks of those nanostructures . This has triggered the development of special instruments which combine spectroscopy and microscopy and allow to perform XPS and XAS with the highest possible lateral resolution of less than 100 nm. 1)More than 10 years ago, two basic, complemetary design principles have been identified to achieve this goal:2) the scanning and the direct imaging type instruments. In the scanning type instruments the photon beam is demagnified, i.e. the X-rays are focused by an optical system (like a Fresnel zone plate or a Schwarzschild objective) on a small spot on the sample. The photoelectrons excited from this area are then collected by a detector. The lateral resolution of the instrument is given by the size of the illuminated area. A surface map can be obtained by scanning the sample relative to the beam. More details of this kind of instruments can be found in the article of T. Munakata in this issue.

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Development of imaging energy analyzer using multipole Wien filter

Cited by 12 publications

References 3 publications

Scanning Tunneling Microscopy and Photoemission Electron Microscopy Studies on Single Crystal Ni<SUB>2</SUB>P Surfaces

Scanning Tunneling Microscopy and Photoemission Electron Microscopy Studies on Single Crystal Ni<SUB>2</SUB>P Surfaces

Energy-filtered X-ray photoemission electron microscopy and its applications to surface and organic materials

Nanoscale Imaging and Spectroscopy with XPEEM

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