2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) 2012
DOI: 10.1109/edaps.2012.6469388
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Development of near-field emission limit from radiated-emission limit based on statistical approach

Kye Yak See
1
,
Ning Fang
2
,
Lin-Biao Wang3
et al.
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Cited by 2 publications
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