2007
DOI: 10.1063/1.2655399
|View full text |Cite
|
Sign up to set email alerts
|

Development of noncontact spring constant measurement and deflection characterization of piezoelectric devices

Abstract: Articles you may be interested inExpression of picogram sensitive bending modes in piezoelectric cantilever sensors with nonuniform electric fields generated by asymmetric electrodes Rev. Sci. Instrum. 81, 125108 (2010); 10.1063/1.3518925 Study on structure optimization of a piezoelectric cantilever with a proof mass for vibration-powered energy harvesting system Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan method Rev. Sci. Instrum. 80, 0… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 11 publications
0
0
0
Order By: Relevance