Advances in Resist Materials and Processing Technology XXVI 2009
DOI: 10.1117/12.813530
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Development of novel UV cross-linkable materials for enhancing planarity in via applications via the correlation of simulated and experimental analyses

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Cited by 4 publications
(3 citation statements)
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“…The thickness less than 10 nm for the stripping test was considered to be acceptable to avoid mixing with the resist. [18][19][20][21]…”
Section: Stripping Testmentioning
confidence: 99%
“…The thickness less than 10 nm for the stripping test was considered to be acceptable to avoid mixing with the resist. [18][19][20][21]…”
Section: Stripping Testmentioning
confidence: 99%
“…In the fablication of solar cell devices using gas barrier materials, both spin coating and chemical vapor deposition (CVD) antireflective coating have respective advantages and disadvantages. Spin coating process using a conventional thermal cross-link planar material was reported to decrease the thicknesses bias between the blanket areas and interconnect areas in lithography techniques [3][4][5][6][7][8]. In addition, CVD was used as another coating method.…”
Section: Introductionmentioning
confidence: 99%
“…The developed sugar-related organic compounds derived from biomass of TPU-AGF-Green1 were shown to be polymerized on the basis of its solvent resistance. 28,29 It was obvious that eco-friendly antiglare film TPU-AGFGreen1 derived from biomass was polymerized by ultraviolet irradiation, in order to avoid generating the defects when separated TPU-AGF-Green1 from disposable replica template.…”
Section: Ultraviolet Curing Properties Of Tpu-agf-green1mentioning
confidence: 99%