2012
DOI: 10.1088/0022-3727/45/27/275102
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Development of robust flexible OLED encapsulations using simulated estimations and experimental validations

Abstract: This work analyses the overall stress/strain characteristic of flexible encapsulations with organic light-emitting diode (OLED) devices. A robust methodology composed of a mechanical model of multi-thin film under bending loads and related stress simulations based on nonlinear finite element analysis (FEA) is proposed, and validated to be more reliable compared with related experimental data. With various geometrical combinations of cover plate, stacked thin films and plastic substrate, the position of the neu… Show more

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Cited by 38 publications
(15 citation statements)
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“…Reducing the bending stress through display film stack design optimization is one of the critical design goals to enable the foldability of displays. Analysis of multi-layer structures for touch panel and OLED displays under bending can be found in works including the analysis of the roles of cover plate and barrier layer in managing bending neutral plane to reduce bending stress [Lee, et. al, 2012;2013;Cheng, et al, 2015;Chiang, et al, 2009], the analytical formulation to relate the bending stress and radius of curvature of the bend in a multilayer structure [Yeh, et al 2014], and the study of delamination, buckling, and cracking on the detailed multilayer TFT structures [van der Slius, et al 2009;.…”
Section: Introductionmentioning
confidence: 99%
“…Reducing the bending stress through display film stack design optimization is one of the critical design goals to enable the foldability of displays. Analysis of multi-layer structures for touch panel and OLED displays under bending can be found in works including the analysis of the roles of cover plate and barrier layer in managing bending neutral plane to reduce bending stress [Lee, et. al, 2012;2013;Cheng, et al, 2015;Chiang, et al, 2009], the analytical formulation to relate the bending stress and radius of curvature of the bend in a multilayer structure [Yeh, et al 2014], and the study of delamination, buckling, and cracking on the detailed multilayer TFT structures [van der Slius, et al 2009;.…”
Section: Introductionmentioning
confidence: 99%
“…Poisson ratio adopted from the literature was 0.37. 29 These basic mechanical properties and the plastic stress–strain relationship were used in the FEA of the PET films with grooves.…”
Section: Methodsmentioning
confidence: 99%
“…(b) are the good ohmic contact indicating that the resistances are accurate. The resistance of the layer on the specimen surface is used to monitor crack evolution . At 20% increment of resistance it determines the critical strain.…”
Section: Experiments and Process Flowmentioning
confidence: 99%