2012
DOI: 10.1063/1.3687428
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Development of soft x-ray time-resolved photoemission spectroscopy system with a two-dimensional angle-resolved time-of-flight analyzer at SPring-8 BL07LSU

Abstract: We have developed a soft x-ray time-resolved photoemission spectroscopy system using synchrotron radiation (SR) at SPring-8 BL07LSU and an ultrashort pulse laser system. Two-dimensional angle-resolved measurements were performed with a time-of-flight-type analyzer. The photoemission spectroscopy system is synchronized to light pulses of SR and laser using a time control unit. The performance of the instrument is demonstrated by mapping the band structure of a Si(111) crystal over the surface Brillouin zones an… Show more

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Cited by 52 publications
(35 citation statements)
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“…In contrast to the free-electron laser measurements described in Sec. II A, the synchrotron measurements at SPring-8 were performed with picosecond x-ray pulses (∼50 ps) at much higher repetition rates 48 (∼500 MHz), resulting in that more than one pulse probe the same volume and that much lower fluences are obtained than at the free-electron laser. Hence, the fluence measurements are very different from the previous study by Schreck et al 37 using LCLS to probe valence-hole reabsorption.…”
Section: Experimental Setup At Bl17su and Bl07lsu Spring-8mentioning
confidence: 99%
“…In contrast to the free-electron laser measurements described in Sec. II A, the synchrotron measurements at SPring-8 were performed with picosecond x-ray pulses (∼50 ps) at much higher repetition rates 48 (∼500 MHz), resulting in that more than one pulse probe the same volume and that much lower fluences are obtained than at the free-electron laser. Hence, the fluence measurements are very different from the previous study by Schreck et al 37 using LCLS to probe valence-hole reabsorption.…”
Section: Experimental Setup At Bl17su and Bl07lsu Spring-8mentioning
confidence: 99%
“…When measuring the transient SPV at the Si (111) 7 × 7 surface the dark carrier lifetime was in excess of the time window, and so a multi-pulse model was required to fit the carrier dynamics since the observed SPV transient was influenced by the residual SPV induced by preceding laser pump pulses [10]. Recently the use of angle-resolved time-of-flight (ARToF) analysers (such as at the BL07LSU beamline at SPring-8, Japan [14]), has allowed synchronisation of the pump laser pulse with hybrid mode pulses in multiple synchrotron periods, enabling SPV measurements extending to μs timescales, in studies of Si (111) [14][15][16], ZnO (0001) [17], and TiO 2 (110) [18].…”
Section: Introductionmentioning
confidence: 99%
“…By varying the time delay between the laser pump and XPS probe, the recombination dynamics is monitored over time, because the band bending and core level binding energies return to equilibrium as carriers recombine. Thus the recombination dynamics at the surface are elucidated [10][11][12][13][14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…The time resolution of MCP is rather fast and better than 200 ps. 25,26) A fluorescence screen shows a long afterglow with a 10% decay time of 0.2 s-1 ms.…”
Section: Overview Of Electron Detectorsmentioning
confidence: 99%