Development of Technique for Making Ohmic Contacts to PEDOT-PSS Films

Bindu, S.; Kumar, Ravi; Suresh, S.

doi:10.1007/978-81-322-1524-0_28

Cited by 7 publications

(3 citation statements)

References 4 publications

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“…A metal semiconductor interface will form either a rectifying junction or an ohmic junction depending on the work functions of the semiconductor film and the contact metal [5][6][7][8]. When the interface is rectifying, the total resistance consists of two parts, the leakage resistance of a reverse biased diode and the bulk resistance of the film.…”

Section: Variation Of Resistance Of Pristine Pedot-pss Films With Timementioning

confidence: 99%

Electric Field Induced Resistance Change in PEDOT-PSS Films

Bindu¹,

Suresh²

2017

BJAST

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Resistance of PEDOT-PSS films changes considerably with time after application of DC voltage. Since, variation of resistance over time can lead to serious errors when used as a strain gauge or gas sensors or any device, a detailed study of the variation of film resistance with time has been made. It has been observed that AC resistance is stable with time (constant) compared to DC resistance which has been explained in terms of contact diode model. It has also been found that doping with graphite leads to lower variation (better stabilization) in the resistance over time. The results indicate that the variation of resistance is an interfacial phenomenon at the contacts and either an ohmic contact or AC measurement removes this behavior. The change of resistance is attributable to high electric field in the interfacial region of the PEDOT-PSS/metal contact.

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Section: Variation Of Resistance Of Pristine Pedot-pss Films With Timementioning

confidence: 99%

Electric Field Induced Resistance Change in PEDOT-PSS Films

Bindu¹,

Suresh²

2017

BJAST

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“…Fig.4 shows the measured impedance Z 23 of the film for varying frequencies from 100Hz to 50 KHz between terminals 2 and 3. From the observations, it is evident that the impedance of the film reduces from 60 KΩ to (Bindu, 2013 andSuresh 2015). rectifying contacts offers very large contact resistances when compared to the bulk resistance of a film and to eliminated contact resistance conventional four probe resistance measurements are made.…”

Section: Introductionmentioning

confidence: 99%

The Determination of Mega Permittivity in PEDOT-PSS Films

Bindu¹

2020

Biosci. Biotech. Res. Comm

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This paper presents measurement of the relative permittivity (εr) of PEDOT-PSS films by measuring the capacitance at metal semiconductor junction. PEDOT-PSS films with and without contact resistances were investigated and it was observed that relative permittivity of the PEDOT-PSS films at low frequencies without contact resistance was large as 5143 and in presence of contact resistances it was 41838 which is 8 times more than the relative permittivity obtained without contact resistance. Such materials with mega permittivity are suitable to build super capacitors.

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“…When a metal to PEDOT-PSS interface is formed, there can be two types of contacts, rectifying contact (Schottky junction) or ohmic contact. formation of rectifying contact or ohmic contact depends on the work function differences between the contact metal and the semiconductor in this case PEDOT-PSS (Bindu and Suresh, 2015;Baca 1997;Bindu et al, 2013). Rectifying contacts offers low resistance for flow of current in the forward direction and substantially high resistance to current flow in the reverse direction.…”

Section: Introductionmentioning

confidence: 99%

Variation of Interfacial Capacitance in PEDOT-PSS Films

Bindu¹

2020

Biosci. Biotech. Res. Comm

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This paper presents a simple method to measure the interfacial capacitance of PEDOT-PSS films by measuring the contact resistance at the metal semiconductor junction. Rectifying behavior was identified for tin and copper contacting PEDOT-PSS films and the order of contact resistance was estimated by a diode model. In this work determination of bulk and contact resistances was made using standard four probe measurement methods. It was found that the contact resistance offered by the metal semiconductor junction is nearly 6 to 7 times more than the bulk resistance of the film. Large contact resistances compared to rest of the film can pose problems as a device. In this study we report that there is an existence of large capacitance at the metal semiconductor interfacial which varies with frequency and applied bias. Existence of large capacitance at the metal semiconductor junction of PEDOT-PSS makes it a contender to be used as super capacitors and is a suitable material to be explored as storage devices. This work can be used to model the performance precisely considering interconnect and contacts in parametric analysis of the circuit.

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Development of Technique for Making Ohmic Contacts to PEDOT-PSS Films

Cited by 7 publications

References 4 publications

Electric Field Induced Resistance Change in PEDOT-PSS Films

Electric Field Induced Resistance Change in PEDOT-PSS Films

The Determination of Mega Permittivity in PEDOT-PSS Films

Variation of Interfacial Capacitance in PEDOT-PSS Films

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