Abstract. The Soft X-ray Imager (SXI) is an imaging spectrometer using charge-coupled devices (CCDs) aboard the Hitomi x-ray observatory. The SXI sensor has four CCDs with an imaging area size of 31 mm × 31 mm arranged in a 2 × 2 array. Combined with the x-ray mirror, the Soft X-ray Telescope, the SXI detects x-rays between 0.4 and 12 keV and covers a 38 0 × 38 0 field of view. The CCDs are P-channel fully depleted, back-illumination type with a depletion layer thickness of 200 μm. Low operation temperature down to −120°C as well as charge injection is employed to reduce the charge transfer inefficiency (CTI) of the CCDs. The functionality and performance of the SXI are verified in on-ground tests. The energy resolution measured is 161 to 170 eV in full width at half maximum for 5.9-keV x-rays. In the tests, we found that the CTI of some regions is significantly higher. A method is developed to properly treat the position-dependent CTI. Another problem we found is pinholes in the Al coating on the incident surface of the CCDs for optical light blocking. The Al thickness of the contamination blocking filter is increased to sufficiently block optical light. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.