2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) 2021
DOI: 10.1109/eptc53413.2021.9663938
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Developments in Advanced Packaging Failure Analysis using Correlated X-Ray Microscopy and LaserFIB

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Cited by 6 publications
(3 citation statements)
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“…Even for ROI targets that are significantly smaller than the grid spacing, their precise locations can be effectively communicated by describing micron-scale distances, measurable from the XRM data, to the sides or corners of any given grid cell. While similar approaches using XRM alone 24,25,32 or in combination with laser-patterned rulers to target subsurface features in bulk materials have been reported before 33 , our approach with a laser-patterned coordinate grid offers a much more comprehensive communication system through its full-sample coverage and alphanumerically labelled axes. The laser ablation process described herein is efficient, requiring minimal ablation time of 80 seconds in this case, and can be tailored to accommodate various grid spacings, rotations, and specimen shapes within the 40 × 40 mm LaserFIB scan field.…”
Section: A Fs Laser-patterned Coordinate Grid To Assist the Linking O...mentioning
confidence: 88%
“…Even for ROI targets that are significantly smaller than the grid spacing, their precise locations can be effectively communicated by describing micron-scale distances, measurable from the XRM data, to the sides or corners of any given grid cell. While similar approaches using XRM alone 24,25,32 or in combination with laser-patterned rulers to target subsurface features in bulk materials have been reported before 33 , our approach with a laser-patterned coordinate grid offers a much more comprehensive communication system through its full-sample coverage and alphanumerically labelled axes. The laser ablation process described herein is efficient, requiring minimal ablation time of 80 seconds in this case, and can be tailored to accommodate various grid spacings, rotations, and specimen shapes within the 40 × 40 mm LaserFIB scan field.…”
Section: A Fs Laser-patterned Coordinate Grid To Assist the Linking O...mentioning
confidence: 88%
“…Commercial standalone laser systems implementing ultra-short-pulsed lasers specifically for sample preparation are effective for large-area preparation and package dissection but lack optimization for the fastest targeted microscopy preparation where ablation speed and sample quality are simultaneously important, since vacuum environments produce the best laser ablation and sample quality, in turn enabling efficiency for the subsequent FIB polishing steps. In contrast, the integrated LaserFIB approach has proven efficient and effective in correlative workflows with optical or XRM microscopy for a variety of research and industrial applications, including characterization of microbumps in a 3D package (14), development of automotive bumpers from recycled materials (15), correlative microscopy for rapid screening of Zr-containing particles for geochronology (16), and identification of random particles within an OLED display (17). Figure 8.…”
Section: Advances In Focused Ion Beam Scanning Electron Microscopesmentioning
confidence: 99%
“…This example involved iterations of two-hour 3D XRM scans to aid process set-up and confirm target accuracy. In this case, the entire XRM to LaserFIB workflow took less than one day (17). Figure 13 shows the steps of the workflow.…”
Section: Advances In Focused Ion Beam Scanning Electron Microscopesmentioning
confidence: 99%