Developments of engineering model of the X-ray CCD camera of the MAXI experiment onboard the International Space Station

Miyata, Emi; Natsukari, Chikara; Kamazuka, Tomoyuki; Akutsu, Daisuke; Kouno, Hiroyuki; Tsunemi, H.; Matsuoka, M.; Tomida, H.; Ueno, S.; Hamaguchi, Kenji; Tanaka, Isao

doi:10.1016/s0168-9002(02)00433-3

Cited by 20 publications

(11 citation statements)

References 10 publications

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“…Therefore, we needed to develop no additional electronics for the SD-CCD. The analog data were processed by an integrated correlated double-sampling (CDS) process 10) which was also developed for conventional CCDs. A readout noise of 7.3 e À rms including the SD-CCD was achieved at an operating temperature of À60 C. We operated a similar CCD without CsI(Tl) with the E-NA system and measured a readout noise of 7.0 e À rms at À60 C. We thus confirm that the deposition of CsI(Tl) and other covering materials has no effect on the electronic performance of the CCD.…”

Section: Methodsmentioning

confidence: 99%

X-Ray Responsivities of Direct-Scintillator-Deposited Charge-Coupled Device

Miyata

Miki

Tawa

et al. 2005

Jpn. J. Appl. Phys.

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We report a new photon-counting detector for 0.1-100 keV X-rays. It consists of an X-ray charge-coupled device (CCD) and a scintillator. The scintillator is directly deposited on the backside of the X-ray CCD. Low energy X-rays below 10 keV can be directly detected by the CCD. The majority of hard X-rays above 10 keV passes through the CCD but can be absorbed in the scintillator, generating visible photons there. Since CCDs have moderate detection efficiency for visible light, visible light can be absorbed by the same CCD. We developed a method of direct deposition of CsI(Tl) forming a needlelike structure on the CCD and succeeded in fabricating the CsI(Tl) deposited CCD (SD-CCD). We investigated the spectral capabilities of our device with 109 Cd and 241 Am. We found that the lateral spread of visible light emitted from needlelike CsI(Tl) was so large that the pulse height of pixels was not significant compared with the noise level. We then operated the SD-CCD in the on-chip binning mode and investigated its spectral capabilities. The energy resolution of the SD-CCD was 52 AE 1% and 42 AE 2% at 22.1 and 59.5 keV, respectively.

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Section: Methodsmentioning

confidence: 99%

X-Ray Responsivities of Direct-Scintillator-Deposited Charge-Coupled Device

Miyata

Miki

Tawa

et al. 2005

Jpn. J. Appl. Phys.

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“…HPK has already successfully developed the CCD with the surface Al coating (CCD-CREST and MAXI-CCD), [9][10][11] so this goal is also considered to be very promising. …”

Section: Ccd For Soft X-ray Imagermentioning

confidence: 99%

Development of fully depleted and back-illuminated charge-coupled devices for soft x-ray imager onboard the NeXT satellite

et al. 2006

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The N eXT (New X-ray Telescope) satellite to be launched around 2010, has a large e ective area in the 0.1-80 keV band with the use of the multilayer super mirror (HXT). As one of the focal plane detectors for N eXT , we have been developing the Soft X-ray Imager (SXI). SXI consists of charge coupled devices (CCDs). In order to increase the quantum e ciency (Q.E.) as high as possible, i.e., to detect X-rays collected by HXT as many as possible, we developed a "fully-depleted and back-illuminated CCD" in the attempt to improve the Q.E. of soft X-rays by the back-illuminated structure and that of hard X-rays by thickening of a depletion layer. Thanks to a high-resistivity (over 10k · cm) n-type Si, we have successfully developed Pch CCDs with very thick depletion layer of over 300 m, which is 4 times thicker than that of established X-ray MOS CCDs (for example XIS, EPIC-MOS and ACIS-I). Furthermore, we have already confirmed we can thin a wafer down to 150 m independent of its resistivity from the experience of the development of the back supportless CCD. Based on these successful results, we fabricated a test device of "fully-depleted and back-illuminated CCD" with the high resistivity (10k · cm) N-type Si thinned down to 200 m. The pixel number and size are 512 × 512 and 24 × 24 m, respectively. For optical blocking, we coated the surface with Al. We evaluated this test device and confirmed the thickness of depletion layer reaches 200 m as we expected. In this paper, we present progress in development of these devices for SXI.

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“…The CCD chip with id number of L1_5-10A2L-2 was a previous model manufactured in 1997, and its performance, particularly depletion layer thickness, is different from recent models for space missions such as MAXI (see Ref. 6). The camera system consists of a CCD camera head, analog electronic box, digital electronics box, and a personal computer which controls the system.…”

Section: Instrumentation and Experimentsmentioning

confidence: 99%

New calibration method for x-ray detection efficiency without using reference counters

et al. 2003

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We propose a new method for absolute calibration of detection efficiency of X-ray detector. The method utilizes measurements with different X-ray incident angles. We first introduce the idea of the method, slant incidence method, in a simplified example. Secondly, we apply the method to measure a filter thickness, using the X-ray CCD camera and a 55 Fe isotope source in order to verify our idea. The slant incidence method functions as we expected, but contradiction as large as 30% is observed against the estimates by conventional on-off method. Finally, we apply the slant incidence method to measure the build-in dead layer thickness of an X-ray CCD. using the X-ray spectrometer as a source. We got reasonable estimates for the thickness of the dead layer. An X-ray spectrometer is used to get the ratio of detected intensity of 45° incidence to that of 0° incidence as a function of X-ray energy. We get reasonable estimates for the thicknesses of two kinds of dead layers, SiO 2 and Si. Discussion on advantages and limitations of this method, and future prospect is mentioned shortly.

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Developments of engineering model of the X-ray CCD camera of the MAXI experiment onboard the International Space Station

Cited by 20 publications

References 10 publications

X-Ray Responsivities of Direct-Scintillator-Deposited Charge-Coupled Device

X-Ray Responsivities of Direct-Scintillator-Deposited Charge-Coupled Device

Development of fully depleted and back-illuminated charge-coupled devices for soft x-ray imager onboard the NeXT satellite

New calibration method for x-ray detection efficiency without using reference counters

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