2010
DOI: 10.1109/led.2010.2052234
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Device Characterization of p/i/n Thin-Film Phototransistor for Photosensor Applications

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Cited by 15 publications
(6 citation statements)
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“…The drain current was gradually increased as the incident light intensity (P IN ) increased, while the threshold voltage was largely shifted toward the positive gate voltage regions (see Figure S9 ). This result implies that the present flexible PDLC-i-OFET devices act as a photosensor, specifically a phototransistor when it comes to the photocurrent change controlled by the gate voltages 38 42 . Here it is noted that the P3HT part plays a key role in photosensing at the wavelength of 550 nm because of no optical absorption by the 5CB molecules 21 , 43 .…”
Section: Resultsmentioning
confidence: 81%
“…The drain current was gradually increased as the incident light intensity (P IN ) increased, while the threshold voltage was largely shifted toward the positive gate voltage regions (see Figure S9 ). This result implies that the present flexible PDLC-i-OFET devices act as a photosensor, specifically a phototransistor when it comes to the photocurrent change controlled by the gate voltages 38 42 . Here it is noted that the P3HT part plays a key role in photosensing at the wavelength of 550 nm because of no optical absorption by the 5CB molecules 21 , 43 .…”
Section: Resultsmentioning
confidence: 81%
“…Following Brandbyge et al and Schirm et al, and assuming a similar current‐induced atomic scale relation of Cu at 650 mV, the estimated force imposed is in the order of 0.9 nN. It is reported that mechanical stress can change the dielectric breakdown in gate oxides . Therefore, during atomic rearrangement the generation of force is very obvious in ECBJ devices.…”
Section: Resultsmentioning
confidence: 91%
“…The photosensitivity becomes maximum when the gate terminal is connected to the anode region. 4 Moreover, the integrated drivers consist of decoders and selectors composed of the low-temperature poly-Si TFT. All pixels can be free-accessed by sending digital data to the decoders, the electric current is measured by the ampere meter, and the total scanning time is 64 ms.…”
Section: Poly-si Thin-film Phototransistor Arraymentioning
confidence: 99%