2021
DOI: 10.1007/978-981-16-1502-3_80
|View full text |Cite
|
Sign up to set email alerts
|

“Device Design of 30 and 10 nm Triple Gate Single Finger Fin-FET for on Current (ION) and off Current (IOFF) Measurement”

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 18 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?