Device Fabrication and Optimisation for Josephson Broadband Spectroscopy of Ferroelectric Thin Films

On transmission line resonances in highTCdc SQUIDs

“…Our analytical solution may provide us with a method of theoretically determining the value of the dielectric constant of the substrate if we use that as a fit parameter between experimental and theoretical graphs. In an earlier work, we have determined R of STO thin films using a Josephson junction based technique called Josephson Broadband Spectroscopy [16,17].…”

“…Figure 5(a) shows the v dc -φ curve in the case when a normal state resistance asymmetry ρ = 0.2 is considered. Figure 5(b) shows the v dc -φ curve in the case when a current [6] (bold black dots) and theoretical simulations from equation (17) for the φ = 0 case. The continuous line is the simulated curve for no asymmetry considered, the dotted line is for the case when current asymmetry is considered and κ = 0.5, the dashed line is for the case when normal state resistance asymmetry is considered and ρ = 0.2 and the dot-dashed line is for the case when both current and resistance asymmetry are considered and κ = 0.5 and ρ = 0. asymmetry κ = 0.5 and resistance asymmetry ρ = 0.2 are considered.…”

On Transmission Line Resonances in High T$_C$ dc SQUIDs

“…Our analytical solution may provide us with a method of theoretically determining the value of the dielectric constant of the substrate if we use that as a fit parameter between experimental and theoretical graphs. In an earlier work, we have determined ǫ R of STO thin films using a Josephson junction based technique called Josephson Broadband Spectroscopy [16,17].…”

“…Eqn. (17) can also be used to simulate the voltage-flux v dc −φ characteristics of a SQUID. We have again used Lee et al's SQUID parameter values to simulate v dc − φ curves for various cases viz.…”

“…Figure 3. (a) Comparison between Lee et al's experimental data read out from[6] (bold black dots) and theoretical simulations from eqn (17). for the φ = 0 case.…”