1996
DOI: 10.1063/1.117440
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Device grade microcrystalline silicon owing to reduced oxygen contamination

Abstract: As-deposited undoped microcrystalline silicon (μc-Si:H) has in general a pronounced n-type behavior. Such a material is therefore often not appropriate for use in devices, such as p-i-n diodes, as an active, absorbing i layer or as channel material for thin-film transistors. In recent work, on p-i-n solar cells, this disturbing n-type character had been successfully compensated by the ‘‘microdoping’’ technique. In the present letter, it is shown that this n-type behavior is mainly linked to oxygen impurities; … Show more

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Cited by 181 publications
(91 citation statements)
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“…However, similar studies as in [19] should be of interest for material with variation of I c RS . Another source of instability with influence on electronic conductivity, which keeps being reported, are oxygen donors in mc-Si:H [31,32]. The various types of oxygen donors in crystalline silicon have been and are still being studied in great detail [33].…”
Section: Discussionmentioning
confidence: 99%
“…However, similar studies as in [19] should be of interest for material with variation of I c RS . Another source of instability with influence on electronic conductivity, which keeps being reported, are oxygen donors in mc-Si:H [31,32]. The various types of oxygen donors in crystalline silicon have been and are still being studied in great detail [33].…”
Section: Discussionmentioning
confidence: 99%
“…The samples were deposited by the VHF-GD deposition technique at a plasma excitation frequency of 110 MHz using a gas purifier [6]. Thereby the ratio of silane flow over total gas flow [SiH 4 ]/[SiH 4 + H 2 ] was varied between 1.25% and 7.5%.…”
Section: Methodsmentioning
confidence: 99%
“…Even though all layers were produced using a gas purifier in order to prevent the incorporation of impurities [6], the microcrystalline materials deposited with high dilutions show a pronounced extrinsic behaviour (Fig. 2) as is usually obtained in the presence of [O] contaminants.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…The purifying technique: A gas purifier (oxygen getter) installed close to the reactor removes oxygen-containing impurities (8). Thereby, low dark conductivities and µc-Si:H single-junction solar cells with 7.7% efficiency could be obtained (6,11). The purifying technique can completely replace the compensation technique.…”
Section: "Mid-gap" Materialsmentioning
confidence: 99%