2016
DOI: 10.1016/j.orgel.2015.11.011
|View full text |Cite
|
Sign up to set email alerts
|

Device performance and density of trap states of organic and inorganic field-effect transistors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
22
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 28 publications
(22 citation statements)
references
References 106 publications
0
22
0
Order By: Relevance
“…A variation by three orders of magnitude of trap DOS is caused by the degree of crystalline order. The trap DOS in organic semiconductors compares well with the one of inorganic semiconductors with the same morphology . Temperature‐dependent space charge limited current density versus applied voltage is another useful method to extract trap density .…”
Section: Charge Transportmentioning
confidence: 99%
“…A variation by three orders of magnitude of trap DOS is caused by the degree of crystalline order. The trap DOS in organic semiconductors compares well with the one of inorganic semiconductors with the same morphology . Temperature‐dependent space charge limited current density versus applied voltage is another useful method to extract trap density .…”
Section: Charge Transportmentioning
confidence: 99%
“…In general, the DOS influences directly on device operation and performance. However, the DOS distribution can be controlled by many factors such as temperature, exposing the organic semiconductor layer to gas and ions as well as the illumination and dipole layer [43,[62][63][64][65][66][67][68][69]. Actually, the Gaussian DOS distribution can be estimated by the following relation [22][23][24][25]69]: (15) where N t is the number of states per unit volume, E is the energy and indicates the energy scale of the density of states (DOS) which also implies the degree of energetic disordered (also called the width of the DOS).…”
Section: Study Of the Effects Of The Illumination And Dipole Layer Onmentioning
confidence: 99%
“…Figure 5 summarizes the energydependent trap DOS for the four different semiconductors, where symbols correspond to the trap DOS determined experimentally from noise measurements (Fig. 4) and the black lines represent the trap distribution derived from the transfer characteristics via numerical modeling 37,39,40 (see details in Supplementary Fig. 9 and Supplementary Note 6).…”
Section: Resultsmentioning
confidence: 99%