The antireflection coating (ARC) can improve the photoelectric conversion efficiency of photovoltaic (PV) cells. In this paper, the influence of film thickness and refractive index of single-layer and double-layer ARC on solar light absorption under different spectral conditions is simulated by the transfer matrix method. The optimum values of ARC film thickness and refractive index are obtained. To optimize it at AM 0 (air mass 0) solar irradiance, a 66 nm thick SiN
x
ARC with a refractive index of 2.0 was used. The PV cell’s maximum power density is 89.87. The maximum power density of the PV cell with double-layer SiN
x
as ARC is 90.94. This work provides a theoretical basis for the application of ARC in ground PV power generation systems and space solar power systems.