2023
DOI: 10.1002/aelm.202201224
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Device‐to‐Materials Pathway for Electron Traps Detection in Amorphous GeSe‐Based Selectors

Abstract: The choice of the ideal material employed in selector devices is a tough task both from the theoretical and experimental side, especially due to the lack of a synergistic approach between techniques able to correlate specific material properties with device characteristics. Using a material‐to‐device multiscale technique, a reliable protocol for an efficient characterization of the active traps in amorphous GeSe chalcogenide is proposed. The resulting trap maps trace back the specific features of materials res… Show more

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Cited by 9 publications
(2 citation statements)
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“…Based on a BEC increasing upon trap charging, an OTS-gauge factor was defined to assess the material's ability to undergo a threshold switch for theoretical screening purposes [98]. Another illustration of the impact of the polaron relaxation model in amorphous Ge 50 Se 50 was given by Slassi et al [142] whose results stressed the dramatic changes in the mobility gap undertaken by the amorphous matrix.…”
Section: Polaron Relaxationmentioning
confidence: 99%
“…Based on a BEC increasing upon trap charging, an OTS-gauge factor was defined to assess the material's ability to undergo a threshold switch for theoretical screening purposes [98]. Another illustration of the impact of the polaron relaxation model in amorphous Ge 50 Se 50 was given by Slassi et al [142] whose results stressed the dramatic changes in the mobility gap undertaken by the amorphous matrix.…”
Section: Polaron Relaxationmentioning
confidence: 99%
“…5a and Fig. 54,55 . In order to nd the origin of the trap states, we projected them onto real space by using the analytical tools for electron wave-functions in the VASPKIT code 56 , as shown in Figs.…”
mentioning
confidence: 96%