DfT techniques for first-time right MCMs-exemplified by a Pentium MCM system

Wyss, J.-P.; Habiger, C.; Hirt, Etienne; Tröster, Gerhard

doi:10.1109/icmcm.1998.670778

Cited by 1 publication

(2 citation statements)

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“…5 is applicable for general MCMs. This (4) (5 1 result is also applicable to PT-MCMs with the same fault assumptions of eqn. 5.…”

Section: Defect Level Estimation Modelsmentioning

confidence: 68%

“…As a result, not all chips in an MCM have design for testability features [3]. For instance, memory chips such as Cache-SRAMs and TAG-SRAMs, which have been used in Pentium MCM systems, are typical examples of not supporting design for testability for the reasons mentioned [4]. In addition, the very hybrid nature of MCMs allows different sources of dies to be Fault coverage (FC), defined as the fraction of defective dies detected in an MCM, is an important parameter in measuring test quality.…”

Section: Introductionmentioning

confidence: 99%

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Fault coverage and defect level estimation models for partially testable MCMs

Tseng¹,

Wang²

2000

IEE Proc., Circuits Devices Syst.

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The authors propose a simple and efficient mathematical model for designers to estimate fault coverage for partially testable multichip modules (MCMs). This model shows a relation between fault coverage, test methodology, and the fraction and distribution of design for testability (DFT) dies in MCMs. Experimental results show that the proposed model can efficiently predict the fault coverage of a partially testable MCM with less than 5% deviation. An automatic DFT dies deployment algorithm, based on the genetic algorithm and the model is proposed to help designers to obtain a fault coverage as close to the upper bound of fault coverage as possible. Two defect level estimation models, which relate fault coverage and manufacturing yield for measuring the test quality of MCMs under equiprobable and non-equiprobable faults, respectively, are also formulated and analysed to support the effectiveness of the model.

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“…5 is applicable for general MCMs. This (4) (5 1 result is also applicable to PT-MCMs with the same fault assumptions of eqn. 5.…”

Section: Defect Level Estimation Modelsmentioning

confidence: 68%

Section: Introductionmentioning

confidence: 99%