“…The normal practice of software-based chain diagnosis usually consists 2-step tests. A chain test that consists of shift-in and shift-out operations is first applied to detect any scan chain fail and to determine the defect type by simply analyzing the faulty shift-out sequence [22]. If a scan chain fails, scan/capture tests that are specifically generated by targeting the faults at scan cell pins are run to help allocate the defect location [23] [24].…”
In this paper, we present a novel approach to run scan diagnosis either on production testers directly or on a few compute machines in a high volume manufacturing (HVM) environment.
“…The normal practice of software-based chain diagnosis usually consists 2-step tests. A chain test that consists of shift-in and shift-out operations is first applied to detect any scan chain fail and to determine the defect type by simply analyzing the faulty shift-out sequence [22]. If a scan chain fails, scan/capture tests that are specifically generated by targeting the faults at scan cell pins are run to help allocate the defect location [23] [24].…”
In this paper, we present a novel approach to run scan diagnosis either on production testers directly or on a few compute machines in a high volume manufacturing (HVM) environment.
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