Diagnosis of parametric defects in dual axis IC accelerometers

Gómez-Pau, Álvaro; Balado, Luz; Figueras, Joan

doi:10.1007/s00542-014-2218-4

Cited by 5 publications

(15 citation statements)

References 21 publications

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“…Filter topology corresponds to a ladder filter implemented with operational transconductance amplifiers (OTA). whole process faster [11], [23]- [25]. Fig.…”

Section: B Indirect Measurements Selectionmentioning

confidence: 99%

Indirect test of M-S circuits using multiple specification band guarding

2016

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Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using easy to measure CUT information that correlates with circuit performances. In this work, a multiple specification band guarding technique is proposed as a method to achieve a test target of misclassified circuits. The acceptance/rejection test regions are encoded using octrees in the measurement space, where the band guarding factors precisely tune the test decision boundary according to the required test yield targets. The generated octree data structure serves to cluster the forthcoming circuits in the production testing phase by solely relying on indirect measurements. The combined use of octree based encoding and multiple specification band guarding makes the testing procedure fast, efficient and highly tunable. The proposed band guarding methodology has been applied to test a band-pass Butterworth filter under parametric variations. Promising simulation results are reported showing remarkable improvements when the multiple specification band guarding criterion is used.Peer ReviewedPostprint (author's final draft

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“…Filter topology corresponds to a ladder filter implemented with operational transconductance amplifiers (OTA). whole process faster [11], [23]- [25]. Fig.…”

Section: B Indirect Measurements Selectionmentioning

confidence: 99%

Indirect test of M-S circuits using multiple specification band guarding

2016

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“…Circuit specifications, as well as test limits, are shown in Table I. The measure space used in this work corresponds to those metrics defined in [18], which are based on the Lissajous composition of input/output signals when a multi tone excitation is applied to the filter [19], [20]. These input/output compositions turn to be quite sensitive to parametric defects, as Fig.…”

Section: A Filter Specificationsmentioning

confidence: 99%

Analog circuits testing using digitally coded indirect measurements

Gómez-Pau

Balado

Figueras

2015

2015 10th International Conference on Design &Amp; Technology of Integrated Systems in Nanoscale Era (DTIS)

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Testing mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy to measure CUT information. In this work, the acceptance/rejection regions are encoded using octrees with arbitrary precision regardless of the complexity of the boundary separating these regions. The strategy relies on two phases: (1) A statistical training phase generates the circuit samples to encode the acceptance/rejection regions using octrees. (2) The testing phase corresponds to the actual production testing of the fabricated ICs. The first phase is performed only once and requires sufficient samples of each pass/fail region to generate the octree under realistic CUT variations. The second phase is fast and only requires to evaluate the octree using the measures of the tested IC. In order to illustrate the proposal, the method has been applied to test a band-pass Biquad filter. Successful simulation results are reported showing considerable advantages in terms of test application time.Postprint (published version

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“…The feasibility of the adaptive monitoring system has been experimentally assessed by using a biquad filter affected by parametric defects. This work only focuses on parametric defects (process, voltage, temperature or [7,11,12] IET Circuits Devices Syst., 2020, Vol. 14 Iss.…”

Section: Introductionmentioning

confidence: 99%

“…As can be observed, both signatures clearly differ from each other; therefore, allowing to identify component deviations or functional misbehaviour using such compositions together with an appropriate method to quantify the deviation level. A methodology for compacting the analogue signature provided by the XY composition has been proposed in [12]. It relies on the displacement of the tangency points of the trace to horizontal and vertical tangent lines, as depicted in Fig.…”

Section: Introductionmentioning

confidence: 99%

Indirect and adaptive test of analogue circuits based on preselected steady‐state response measures

Gómez-Pau

Lupon

Balado

et al. 2020

IET Circuits, Devices & Systems

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Alternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively generates an indirect digital signature characterising the circuit under test, which is later used to diagnose the actual performances relying on a statistical dictionary-based diagnosis method. The system is composed of an integrated digital signature generator and a digital control and acquisition subsystem. The signature generator is based on a converter architecture, in which the analogue range can be adapted to the magnitude of the indirect measure using the well known information of the fault-free circuit. The digital subsystem controls the proposed architecture and stores the digital codes sent by the integrated digital signature generator. The digital signature generator has been designed and fabricated in an industrial 65 nm complementary metaloxide-semiconductor technology from STMicroelectronics, whereas the digital control and acquisition subsystem have been prototyped in a field-programmable gate array. The fabricated system has been used to test a biquad filter affected by parametric variations. Successful experimental results are reported showing the capabilities of the proposed adaptive test system to diagnose circuit performances with discrepancies as low as 1% of the actual real value.

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Diagnosis of parametric defects in dual axis IC accelerometers

Cited by 5 publications

References 21 publications

Indirect test of M-S circuits using multiple specification band guarding

Indirect test of M-S circuits using multiple specification band guarding

Analog circuits testing using digitally coded indirect measurements

Indirect and adaptive test of analogue circuits based on preselected steady‐state response measures

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