2020
DOI: 10.1049/iet-smt.2020.0225
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Diagnostic aspects of partial discharge measurement at very low frequency: a review

Abstract: Electrical insulation of high voltage (HV) power equipment/apparatus plays very important roles in the sound functioning of power systems. Examining the insulation condition through partial discharge (PD) measurements has considerable importance as the presence of PDs in any HV systems stands for a sign of defects and degradations in electrical insulation. Generally, the PD measurements are performed with a supply voltage of normal power frequency (PF-50/60 Hz). As an attractive alternative, the PD measurement… Show more

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Cited by 10 publications
(11 citation statements)
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References 89 publications
(257 reference statements)
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“…This shows that the K‐SVD dictionary has higher coherence with Φ . However, the distribution of μ between the transfer SR dictionary and Φ is less than 4 and concentrated in [1, 3]. The reason is that the transfer SR dictionary is based on the parameter tuning of the intrinsic pulse dictionary.…”
Section: Simulation Analysismentioning
confidence: 99%
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“…This shows that the K‐SVD dictionary has higher coherence with Φ . However, the distribution of μ between the transfer SR dictionary and Φ is less than 4 and concentrated in [1, 3]. The reason is that the transfer SR dictionary is based on the parameter tuning of the intrinsic pulse dictionary.…”
Section: Simulation Analysismentioning
confidence: 99%
“…eU ) 20:end for 21:F e = (F e (1) , F e (2) , … , F e (t ∕l ) ) Note: 𝜎 is the EMF iteration residual threshold; d is the maximum number of iterations.…”
Section: Algorithm 1 Obtaining the Intrinsic Pulse Oscillation Wavefo...mentioning
confidence: 99%
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“…In [93] a correlation between gate oxide degradation and the MOSFET intrinsic capacitive couplings are reported, where it is proposed to use the MOSFET change in capacitance as a precursor to the gate oxide degradation, however the mechanisms behind the proposed correlation are unclear. Another phenomenon related to the insulation degradation in PEC systems is the partial discharge phenomenon, which in various studies have been documented to cause long term degradation of dielectric material insulation properties [94]- [96]. Particularly in WBG enabled MV PECs the partial discharge inception voltage will decrease with higher dv/dt posing an increased threat in terms of reliability [97]- [101].…”
Section: Reliability and Thermal Stressesmentioning
confidence: 99%
“…PD occurs in a variety of locations and insulation mediums in electrical apparatus. PD may be due to the presence of gas bubbles, voids, or impurities in solid insulation, at conductor-dielectric interfaces, liquid insulation and along the surface of insulators [1,2]. Irrespective of the causal mechanism, PD is a precursor to insulation failure.…”
Section: Introductionmentioning
confidence: 99%