Experimental results are reported from two measurement techniques ͑semiconductor switching and electro-optic sampling͒ that allow temporal characterization of electron bunches produced by a laser-driven plasma-based accelerator. As femtosecond electron bunches exit the plasma-vacuum interface, coherent transition radiation ͑at THz frequencies͒ is emitted. Measuring the properties of this radiation allows characterization of the electron bunches. Theoretical work on the emission mechanism is presented, including a model that calculates the THz wave form from a given bunch profile. It is found that the spectrum of the THz pulse is coherent up to the 200 m thick crystal ͑ZnTe͒ detection limit of 4 THz, which corresponds to the production of sub-50 fs ͑rms͒ electron bunch structure. The measurements demonstrate both the shot-to-shot stability of bunch parameters that are critical to THz emission ͑such as total charge and bunch length͒, as well as femtosecond synchronization among bunch, THz pulse, and laser beam.