Die Massenabsorptionskoeffizienten der K-Strahlungen leichter Elemente

Weisweiler, Werner

doi:10.1007/bf01262910

Cited by 14 publications

(2 citation statements)

References 32 publications

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“…Computed values for p/p (table 3) are illustrated graphically in figure 4, a plot of log (p/p) ( A / Z ) against log 2, in order to facilitate comparison with other data. It should be noted that, apart from Henke's directly measured data, the present values are generally different from those often quoted in the literature (Weisweiler 1970); this is particularly the case for elements whose absorption edges are close to the energy of oxygen K x-rays. Data derived from microanalysis measurements (Kohlhaas and Scheiding 1970) clearly disagree for high values of p/p.…”

Section: Discussioncontrasting

confidence: 96%

“…Values of mass absorption coefficients for soft x-rays have been reviewed by Weisweiler (1970). Absolute values of p / p obtained by an x-ray reflection technique (Ershov et a1 1967) as well as by absorption measurements in thin films of material (Lukirski et a1 1964) are reported, and, although reproducibilities approaching 10 % were claimed, discrepancies between the two sets of data sometimes reached 50 %.…”

Section: Introductionmentioning

confidence: 99%

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Electron probe microanalysis using oxygen x-rays: I. Mass absorption coefficients

Love

Cox

Scott

1974

J. Phys. D: Appl. Phys.

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Electron probe microanalysis of oxygen in a range of binary and ternary oxides is described. Experimental data are presented for a range of electron accelerating voltages and for two different take-off angle instruments. The ratio of oxygen K emission from specimen and standard is found to reach a limiting value, the same for each instrument, as the applied voltage is increased. The observations are shown to support the thin-film model (Duncumb and Melford 1966) proposed for quantitative analysis of light elements and also to enable its range of applicability to be established in terms of specimen characteristics and experimental conditions. The model is used together with chemical composition data for the oxides, and a consistent set of mass absorption coefficients are calculated which are considered to be accurate within 10%. These new data are discussed and compared with previously published values.

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Section: Discussioncontrasting

confidence: 96%

Section: Introductionmentioning

confidence: 99%

Electron probe microanalysis using oxygen x-rays: I. Mass absorption coefficients

Love

Cox

Scott

1974

J. Phys. D: Appl. Phys.

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Elektronenstrahl‐Mikroanalyse leichter Elemente

Fitzer

Weisweiler

1976

Chemie Ingenieur Technik

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Mit der auflerordentlich raschen Verbreitung der Elektronenstrahl-Mikroanalyse in der Festkorperchemie zur quantitativen, zerstorungsfreien Erfassung der ortlichen Elementverteilung im Bereich von Mikrometern ist die Reihe der bisher nachweisbaren Elemente auch auf die leichten Elemente Fluor bis Beryllium ausgedehnt worden. In vorliegendem Fortschrittsbericht sollen diejenigen Gesichtspunkte der Mikroanalyse leichter Elemente kritisch untersucht werden, die sich gegeniiber denen bei schweren Elementen unterscheiden. Dazu wird ein kurzgefaflter Uberblick zur Gerateausriistung, den Meflbedingungen, allgemeinen Proben-Anforderungen und atomphysikalischen Daten der zu analysierenden Elemente gegeben. Auf die Forschungsergebnisse iiber den Einflufl der Kontamination, der Energielage und Intensitat der weichen Rontgen-Linien, der Porositiit und elektrischen Leitfahigkeit der Proben sowie auf die Frage des Standards wird hingewiesen. Die zu untersuchenden Proben von oft weniger als 1 mm Kantenlange werden zunachst in Epoxid-Harz zum Zwecke des Schleifens und Polierens (Diamant-Paste, Kornung 0,25 pm) eingebettet und hernach in der elektrisch besser leitenden Wood-Legierung prapariert.:P Prof. Dr. E . Fitter und Univ.-Doz. Dr.

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