Dielectric and ferroelectric studies of KNN thin film grown by pulsed laser deposition technique

Sharma, Shweta; Kumar, Ashok; Gupta, Vinay; Tomar, Monika

doi:10.1016/j.vacuum.2018.11.036

Cited by 21 publications

(8 citation statements)

References 23 publications

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“…Also, the K (1−x) Na x NbO 3 films have been deposited by pulsed laser deposition (PLD), and the electrical, dielectric, and ferroelectric properties of K (1−x) Na x NbO 3 thin films were investigated. The measured dielectric constant (∼ 531) of K (1−x) Na x NbO 3 thin film was found to be in agreement with the value reported in the literature [5]. Pradhan et al [6] have investigated the time dependence of the domain relaxation mechanism in K 0.5 Na 0.5 NbO 3 thin films grown on La 0.67 Sr 0.33 MnO 3 /SrTiO 3 (001) substrates by a scanning probe microscopy and observed that the K 0.5 Na 0.5 NbO 3 thin films exhibit excellent charge and domain retention.…”

Section: Introductionsupporting

confidence: 89%

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films

Li,

Liu,

et al. 2024

Acta Phys. Pol. A

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An evolved nonlinear thermodynamic theory is used to investigate the phase structures and electromechanical properties of differently oriented K0.5Na0.5NbO3 thin films. It is revealed that notable distinctions in the phase structure of K0.5Na0.5NbO3 thin films, with decreasing symmetry observed in the order of ( 111), (001), and (110) orientations, and these microphase structural variances translate into distinct electromechanical properties. Moreover, it is observed that the oriented K0.5Na0.5NbO3 thin films exhibit commendable out-of-plane dielectric and piezoelectric properties around the specific phase boundaries, such as Maac-Oaa and Tec-PE phase boundaries for (001) oriented films, Maac-Oaa and Tec-PE phase boundaries for (110) oriented films, Raaa-PE phase boundary for (111) oriented films. Specifically, near room temperature, the (001) and (110) oriented K0.5Na0.5NbO3 thin films outperform (111) oriented K0.5Na0.5NbO3 thin films in terms of dielectric properties, featuring a dielectric constant exceeding 2500. Furthermore, (001) oriented K0.5Na0.5NbO3 thin films exhibit superior out-ofplane piezoelectric properties compared to other orientations, with a remarkable piezoelectric coefficient d33 exceeding 1000 pm/V. These results underscore the significant impact of strain and temperature regulation on electromechanical properties. Meanwhile, by strategically adjusting these parameters, it becomes feasible to fabricate high-properties piezoelectric devices.

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Section: Introductionsupporting

confidence: 89%

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films

Li,

Liu,

et al. 2024

Acta Phys. Pol. A

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“…1g-1h show the XRD pattern of the KNLNS-BBNZ and KNLNS-BCZ thin films fabricated at 300 mTorr, 2 J/cm 2 , 700 °C, and frequencies of 5 and 10 Hz. The patterns of the KNLNS-BBNZ thin films (Figure 1g) show a reflexion around 30° 2θ related to a secondary phase, which increase as the frequency decreases, which was reported in previous works as a pyrochlore phase [12]. The XRD patterns of the KNLNS-BCZ thin films (Figure 1h) present a perovskite structure at both frequencies.…”

Section: A Structural Characteristicssupporting

confidence: 79%

“…In both compositions, the patterns show a perovskite structure with secondary phases in most of the films. Previous reports have described the secondary phases due to the alkali metals volatility, forming pyrochlore or ternary oxide with different stochiometric instead of perovskite structure [11,12]. The XRD patterns suggests that the thin films obtained at 700 °C have a smaller secondary phase.…”

Section: A Structural Characteristicsmentioning

confidence: 81%

Lead-free KNN-based thin films obtained by pulsed laser deposition

Carreño-Jiménez

Benitez-Benitez²,

Castañeda-Guzmán³

et al. 2022

2022 IEEE International Symposium on Applications of Ferroelectrics (ISAF)

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In thiswork, 0.96(K0.48Na0.52)0.95Li0.05Nb0.94Sb0.06O3-0.04Ba0.94Ca0.06ZrO3 (KNLNS-BCZ) and 0.98(K0.48Na0.52)0.95Li0.05Nb0.95Sb0.05O3-0.02Ba0.5(Bi0.5Na0.5)0.5ZrO3 (KNLNS-BBNZ) ferroelectric thin films were obtained by pulsed laser deposition. The structural, and morphological characteristics were studied to determine the best deposition parameters and analyse the piezoelectric properties. The studied deposition parameters were temperature, laser fluence, oxygen partial pressure and frequency. These parameters impact important characteristics of the thin films like grain morphology, thickness, and roughness. KNLNS-BCZ thin films with pure perovskite structure, homogeneous grain growth, and thickness ≥100 nm were fabricated at 700 °C, 2 J/cm 2 , 300 mTorr, and frequencies of 5 Hz and 10 Hz. These films presented good ferroelectric behaviour and piezoelectric coefficient d33eff of 83.80 pm/V and 25.80 pm/V, respectively.

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“…Unlike the above-discussed defects, these can be readily identified by X-ray diffraction (XRD) and have been previously reported in several works. These secondary phases are usually characterized either as a pyrochlore phase, [59][60][61] TTB phase, [62,63] or other alkali-deficient phases [64][65][66] which have a large difference in their crystal structure as well as physical properties. Unfortunately, they are confused with each other due to the closely lying high-intensity XRD peaks in the 2θ range of 28°-30°.…”

Section: Secondary Phases (3d)mentioning

confidence: 99%

Diverse Defects in Alkali Niobate Thin Films: Understanding at Atomic Scales and Their Implications on Properties

Waqar

Chai

et al. 2022

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Defects in ferroelectric materials have many implications on the material properties which, in most cases, are detrimental. However, engineering these defects can also create opportunities for property enhancement as well as for tailoring novel functionalities. To purposely manipulate these defects, a thorough knowledge of their spatial atomic arrangement, as well as elastic and electrostatic interactions with the surrounding lattice, is highly crucial. In this work, analytical scanning transmission electron microscopy (STEM) is used to reveal a diverse range of multidimensional crystalline defects (point, line, planar, and secondary phase) in (K,Na)NbO3 (KNN) ferroelectric thin films. The atomic‐scale analyses of the defect‐lattice interactions suggest strong elastic and electrostatic couplings which vary among the individual defects and correspondingly affect the electric polarization. In particular, the observed polarization orientations are correlated with lattice relaxations as well as strain gradients and can strongly impact the properties of the ferroelectric films. The knowledge and understanding obtained in this study open a new avenue for the improvement of properties as well as the discovery of defect‐based functionalities in alkali niobate thin films.

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Dielectric and ferroelectric studies of KNN thin film grown by pulsed laser deposition technique

Cited by 21 publications

References 23 publications

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films

Lead-free KNN-based thin films obtained by pulsed laser deposition

Diverse Defects in Alkali Niobate Thin Films: Understanding at Atomic Scales and Their Implications on Properties

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Dielectric and ferroelectric studies of KNN thin film grown by pulsed laser deposition technique

Cited by 21 publications

References 23 publications

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K0.5Na0.5NbO3 Thin Films

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K0.5Na0.5NbO3 Thin Films

Lead-free KNN-based thin films obtained by pulsed laser deposition

Diverse Defects in Alkali Niobate Thin Films: Understanding at Atomic Scales and Their Implications on Properties

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Product

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Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films

Phase Structures and Electromechanical Properties of Differently Oriented Epitaxial K_0.5Na_0.5NbO₃ Thin Films