Dielectric And Relaxation Studies in Multi Oxides Doped Borotellurite Glasses

Malge, Amarkumar; Sankarappa, T.; Devidas, G.B.; Ashwajeet, J. S.; Devidas, Ashwini; Heerasingh, Mohansingh

doi:10.1088/1757-899x/1221/1/012015

Cited by 2 publications

(3 citation statements)

References 22 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…So, the electrical relaxation in ZVBS1 glass is a pure bulk phenomenon. This reveals the existence of single phase with non-Debye type relaxation in all the current glasses [18,22]. The remaining glasses in the current series displayed changes in Zʹ and Zʹʹ same as that of ZVBS1 glass.…”

Section: Impedence Spectroscopy (Z)supporting

confidence: 51%

“…The ions move freely within the potential well only on the higher frequency side of the Mʹmax region. On the lower frequency side of the Mʹmax region, ion drifts over extended distances [22].…”

Section: Electric Modulus (M)mentioning

confidence: 99%

“…The relaxation time, τ was determined by applying the condition, ωpτp = 1 where, ωp = 2πfp [24]. According to the theory that relaxation is also thermally activated process associated with certain activation energy and is expressed again in the Arrhenius form as [22], τ = 𝜏 0 𝑒𝑥𝑝 ( As per Eq. ( 10), the sketches of ln(Mʹʹ) and ln(Zʹʹ) as a function of (1000/T) are made in Figures 7 and 8, respectively.…”

Section: Relaxation Mechanismmentioning

confidence: 99%

See 2 more Smart Citations

Dielectric relaxation studies in Sm₂O₃ doped boro-zinc-vanadate glasses

Ashwini,

Sankarappa,

Amarkumar

et al. 2024

IOP Conf. Ser.: Mater. Sci. Eng.

View full text Add to dashboard Cite

In this work, the conventional melting procedure was adopted to synthesize glasses with a composition of (ZnO)0.3 – (V2O5)0.3 – (B2O3)0.4-x – (Sm2O3)x, x = 0.002, 0.005, 0.007, 0.01 and 0.02 mol%. The dielectric properties of these glasses were measured. The dielectric constant (εʹ) and dielectric loss (εʹʹ) of glasses are found to vary in the range from 1.9177x102 to 3.9456x103 and from 1.5751 to 6.9095x105 respectively for the temperature range 343 K – 573 K and frequency range 50 Hz to 10 MHz. With increase of frequency, both dielectric constant and loss decreased and increased with increase of temperature. The analysis of dielectric constant and dielectric loss confirmed that the phenomenon of dielectric relaxation is mainly due to the frequency-dependent polarization mechanism. Electric modulus and impedence spectroscopy revealed non-Debye type and a single phase relaxation process. Activation energy for dc conductivity and dielectric relaxation are found to be of same size indicating that the potential barrier encountered by the charge carriers is same in both the processes. The master curves suggested that temperature-independent relaxation is occurring in the present glasses. The high values of measured dielectric parameters suggest that the present glasses are suitable in semiconducting and energy storage applications.

show abstract

Section: Impedence Spectroscopy (Z)supporting

confidence: 51%

Section: Electric Modulus (M)mentioning

confidence: 99%

Section: Relaxation Mechanismmentioning

confidence: 99%

See 1 more Smart Citation