2020
DOI: 10.1063/1.5142130
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Dielectric and structural analysis of hexagonal and tetragonal phase BaTiO3

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Cited by 26 publications
(12 citation statements)
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“…In our geometry, the capacitance can be calculated as two parallel plate capacitors in series, one with SiO 2 and another one with BTO as dielectrics where C X = ε 0 ·ε x / d x with ε 0 the vacuum electrical permittivity and ε x and d x the relative permittivity and the thickness of medium “ x ” (SiO 2 or BTO) respectively. Because of the very high ε r expected for BTO (∼4000), in this geometry the capacitance will be strongly dominated by the SiO 2 contribution. This is advantageous to extract accurate field-effect mobility values even in the case of not knowing the exact dielectric value of the BTO ultrathin layer.…”
supporting
confidence: 73%
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“…In our geometry, the capacitance can be calculated as two parallel plate capacitors in series, one with SiO 2 and another one with BTO as dielectrics where C X = ε 0 ·ε x / d x with ε 0 the vacuum electrical permittivity and ε x and d x the relative permittivity and the thickness of medium “ x ” (SiO 2 or BTO) respectively. Because of the very high ε r expected for BTO (∼4000), in this geometry the capacitance will be strongly dominated by the SiO 2 contribution. This is advantageous to extract accurate field-effect mobility values even in the case of not knowing the exact dielectric value of the BTO ultrathin layer.…”
supporting
confidence: 73%
“…This is advantageous to extract accurate field-effect mobility values even in the case of not knowing the exact dielectric value of the BTO ultrathin layer. We have fabricated a parallel plate capacitor using a freestanding BTO layer as dielectric to experimentally determine its dielectric constant (see Supporting Information Figure S12) finding a value of ε BTO = 4700 ± 500, in good agreement with the values reported for bulk BTO at room temperature. In Figure a we note that the additional structure in the IV g curve (double hump feature) is a manifestation of the ferroelectric switching of the BTO layer. Similar features have been observed in devices with a ferroelectric layer. ,,, …”
mentioning
confidence: 99%
“…It can simulate solar cell structures and calculate their basic characteristics, such as band diagrams, external quantum efficiency, generation and recombination profiles, cell current densities, J–V characteristics including open-circuit voltages ( Voc ), short-circuit currents ( Jsc ), fill factor ( FF ), and power conversion efficiency ( PCE ). For SCAPS simulations, the input parameters are taken from the literature [ 2 , 11 , 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 , 25 , 26 , 27 ] and our experimental results, which are listed in Table 1 . The interface defects at ETL/absorber and absorber/HTL interfaces are considered neutral and single.…”
Section: Methodsmentioning
confidence: 99%
“…TC for PZT in this study is a little higher than reported TC for the composition PZT 50/50, showing the fabricated film composition is on the Ti-rich end as discussed above. PZT-based ceramics are virtually among the best dielectric materials with a highest dielectric constant compared with that of other dielectric ceramics such as BaTiO3 (εr~ 6,000 at 1 kHz), PbTiO3 (1,100 at 1KHz) (Yusoff et al, 2020;Chaudhari & Bichile, 2013).…”
Section: Electrical Measurementsmentioning
confidence: 99%