Dielectric breakdown of polyimide films: Area, thickness and temperature dependence

Electric Breakdown Model for Super-Thin Polyester Foil

“…The solid line and dash line represent the linear fits. This result is not in good agreement with typical value found in the literature for polymers and for such a litter variation of the thickness (Diaham et al, 2010;Helgee&Bjellheim, 1991).…”

“…This 'curious' behavior also can be interpreted with the percolation theory. It based on a priori supposed that when the probability to find defects into the bulk increases, an increase in the scattering of the breakdown and a decrease in the shape parameter value ought to be observed (Diaham et al, 2010;Essam, 1980;Helgee&Bjellheim, 1991). (Ieda, 1987).…”

“…Both the maximum likelihood and least square fit methods have been also applied leading to similar -and -parameter values (Diaham et al, 2010;Laihonen et al, 2007aLaihonen et al, , 2007b.…”

“…It was found that the -parameter has presented an unexpected increase with increasing the thickness thanks to percolation theories (Diaham et al, 2010). …”

Dielectrics for High Temperature SiC Device Insulation: Review of New Polymeric and Ceramic Materials

“…Consequently, the following section only gives the main experimental observable tendencies on the breakdown field of thermo-stable dielectrics. Recently, the influence of several parameters on the dielectric strength has been reported for BPDA/PDA PI and PA-F films (Diaham, 2010b;Khazaka, 2011a). Figure 9 shows the electrode area influence on the cumulative probability versus E BR at room temperature for BPDA/PDA PI and PA-F films.…”