Dielectric characterization using the microstrip resonator method

Abstract

Absfrucl: Microstrip ring resonators and end coupled resonators with different substrate width, feed line length and gap width are fabricated and the is measured. It is shown that these parameters can critically affect measurement results. A substrate width of twice the resonator diameter for the sample is recommended for correct measurement of 6. The effect of the coupling gap hetween the feed line and the resonator is investigated where too small a gap can induce a change of resonant frequency resulting in a measurement error for e extraction. A suitable gap is recommended for each type of substrate under examination.

Destructive Dielectric Characterization of Material Using Microstrip Ring Resonator.

“…Material measurement is a very important step to be conducted before integrating 403 these materials in some applications. The method used here to extract the permittivity is Microstrip Ring Resonator [3][4][5]. To extract permittivity, 2 strategies are used, First the material to be measured is printed on the ring substrate (destructive strategy) and then when the ring resonator is sandwiched between 2 materials (non-destructive strategy).…”

“…There are different methods of dielectric properties measurements like non-resonant and resonant methods [3][4][5]. Resonant methods do not have a sweep frequency capability for the measured frequency, but they are considered more accurate than any other techniques for low loss material and they have possible Q-factors and results in very high sensitivity.…”