“…C URRENTLY, the life time of electrostatically actuated RF microelectromechanical system (MEMS) capacitive switches is primarily limited by dielectric charging, which can cause actuation-voltage shift or, ultimately, stiction [1]- [25]. Experimentally, the dielectric charging phenomenon has been investigated by monitoring shifts in RF transmission characteristics [24], electrostatic and adhesion forces [14], capacitance-voltage characteristics [2]- [6], [8]- [11], [16], and current-voltage characteristics [7], [17], [18], [20], [25] with an increasing level of physical understanding.…”