2013
DOI: 10.1016/j.ceramint.2012.08.006
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Dielectric enhancement of BaSrTi1.1O3/BaSrTi1.05O3/BaSrTiO3 multilayer thin films prepared by RF magnetron sputtering

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Cited by 34 publications
(15 citation statements)
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“…Using (ε BZT /ε BST )<1 in eq (3) demonstrates that the effective dielectric constant, ε eff lies between the dielectric constant of individual multi layers BST and BZT thin films i.e., ε BST >ε eff >ε BZT . Similar results were reported for compositionally graded multilayer thin films [6]. The electric field dependence of dielectric constant of the bilayer structure shown in Fig.…”
Section: Dielectric Propertiessupporting
confidence: 88%
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“…Using (ε BZT /ε BST )<1 in eq (3) demonstrates that the effective dielectric constant, ε eff lies between the dielectric constant of individual multi layers BST and BZT thin films i.e., ε BST >ε eff >ε BZT . Similar results were reported for compositionally graded multilayer thin films [6]. The electric field dependence of dielectric constant of the bilayer structure shown in Fig.…”
Section: Dielectric Propertiessupporting
confidence: 88%
“…3. The contribution of dielectric constant corresponding to BST/BZT multi-layer structure is not only due to the contribution as predicted by Maxwell-Wagner model [6], but also from other contributions such as strain induced polarization, mismatch of lattice parameters of individual layers [29][30] and the contribution of co-existent phases present in the morphotropic phase boundary composition corresponding to BZT thin films [25]. The effective capacitance of a multilayer structure can be obtained by considering the capacitances of all constituent thin films.…”
Section: Dielectric Propertiesmentioning
confidence: 88%
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“…The FOM of BMN–BST composite thin films is ~88. According to the above results, the figures of merits four PCBLs and BMN–BST composite thin films are higher than that of the SiN/BST, MgO/BST, BZN/BST, and BaSrTi 1.1 O 3 /BaSrTi 1.05 O 3 /BaSrTiO 3 thin films.…”
Section: Resultsmentioning
confidence: 73%