Dielectric exchange: The key repulsive or attractive transient forces between atomic force microscope tips and charged surfaces

Abstract

A critical look at surface force measurement using a commercial atomic force microscope in the noncontact mode Rev.

Two-dimensional phase transition of styrene adsolubilized in cetyltrimethylammonium bromide admicelles on mica

“…To insure the tip was clean and ready for reuse, a force curve of mica in deionized water was first captured and compared with a clean tip run. The tip and the fluid cell were considered to be clean and ready for reuse when the force curve was qualitatively similar to the "clean" tip curve [25][26][27][28].…”

Imaging of soft structures: Dependence of contrast in atomic force microscopy images on the force applied by the tip

“…The atomic force microscope ͑AFM͒ obtains topographical information from the shortrange repulsion resulting from the overlap of electronic shells between the tip and sample. 8 However, the presence of long-range interactions such as the double layer electrostatic force [9][10][11][12][13] when scanning soft samples in liquid media leads to a very different imaging scenario. The purpose of this article is to report on forces acting on the tip when imaging soft samples, as surfactant layers, in liquid media and to determine their effects on the AFM image contrast.…”

Self-Consistent Mean-Field Theory for Room-Temperature Ionic Liquids

“…The effective relative permittivity, which depends on the local distribution of the polar and apolar components, is thus higher at the surface than in the bulk since the polar components of the counterion are accumulated on the electrode's surface. This is the opposite trend to the one typically found in aqueous electrolytes, (James & Healy, 1972;Teschke & de Souza, 1999) in which the ion polarizability is known to decrease in high electrostatic fields. Details of the SCMFT used to model RTILs at electrified interface are given in the following section.…”