2009
DOI: 10.1063/1.3239516
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Dielectric function of zinc-blende AlN from 1 to 20 eV: Band gap and van Hove singularities

Abstract: The dielectric function (DF) of phase-pure cubic AlN films is determined by ellipsometry. The sharp onset of the imaginary part of the DF defines the direct absorption edge corresponding to a conduction-to-valence band spacing at the center of the Brillouin zone (BZ) of 5.93 eV. Phonon-assisted transitions lead to the pronounced absorption tail below this edge from which the indirect gap of zinc-blende AlN is estimated with 5.3 eV. Transitions due to four additional critical points of the BZ are resolved at hi… Show more

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Cited by 58 publications
(46 citation statements)
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References 28 publications
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“…We associate the peak position in the wavelength dependence of n with the onset for optical electron-hole transition and correspondingly with the band gap E g of the alloy (i.e., E g = E 0 ). As was shown in previous studies with c-GaN [24], c-AlN [25], and (AlGa)N alloys [8] this is a good approximation and the values of E g defined in such a way are presented in Table I. We do not see any experimental evidence of indirect band gap in (AlGa)N which could happen when x approaches the value of 0.7 [8].…”
Section: A Complex Refractive Indexsupporting
confidence: 84%
See 1 more Smart Citation
“…We associate the peak position in the wavelength dependence of n with the onset for optical electron-hole transition and correspondingly with the band gap E g of the alloy (i.e., E g = E 0 ). As was shown in previous studies with c-GaN [24], c-AlN [25], and (AlGa)N alloys [8] this is a good approximation and the values of E g defined in such a way are presented in Table I. We do not see any experimental evidence of indirect band gap in (AlGa)N which could happen when x approaches the value of 0.7 [8].…”
Section: A Complex Refractive Indexsupporting
confidence: 84%
“…The values of E g measured in [8] are much closer to our data. We note that there is also a difference for c-AlN measured in [6,7] and more recent works on c-AlN [25] and (AlGa)N alloys [8]. The differences of our ellipsometry data with values obtained in earlier works [6,7] could possibly be related to different quality of the grown material, the accuracy of defining x, different substrates, and the models used in the ellipsometric analysis.…”
Section: A Complex Refractive Indexcontrasting
confidence: 67%
“…The sharp onset above 7.20 eV is correlated with a critical point around the X-point of the BZ and above 7.95 eV is due to transitions along the [11 l]-direction. Other two transitions at 11.14 eV and 12.52 eV are assigned to L-andT-points of BZ [38], For comparison, ab-initio density functional theory [39] calculated results give a slightly larger band gap (6.18 eV). Instead of a main peak at 7.20 eV, a wide peak in the range of 7 to 10 eV is observed with a maximum at 8.04 eV.…”
Section: Comparison Of Structure-related Dielectric Functionsmentioning
confidence: 95%
“…Modified MDF seems to be closer to the experimental results than LDA first-principle calculations. For Zincblende A1N films, we take Roppischer's data [38] as an example. The sample was grown by RF plasma-assisted MBE on free 3C-SiC(001) substrates and the dielectric functions were recorded by a commercial ellipsometer.…”
Section: Comparison Of Structure-related Dielectric Functionsmentioning
confidence: 99%
“…For instance, the In the inset of (a) the k-point density is increased by about one order of magnitude, while only quasielectronquasihole pairs with energies <10 eV and a broadening parameter of η = 0.1 eV are taken into account. Experimental spectra for zb-AlN [36] and wz-AlN [37] (black solid lines) are given for comparison. From [35] simplification of the QP treatment, e.g.…”
Section: Validity Of Scenario Of Van Hove Singularitiesmentioning
confidence: 99%