1987
DOI: 10.1049/ip-h-2.1987.0068
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Dielectric measurements with an open-ended coaxial probe

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Cited by 166 publications
(122 citation statements)
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“…The complex relative permittivity of a sample can thus be determined from S 11 in line with the following bilinear equation that is based on (9), (13), and (14) [23], [9] …”
Section: B Open-ended Coaxial Probe (Oc)mentioning
confidence: 99%
See 1 more Smart Citation
“…The complex relative permittivity of a sample can thus be determined from S 11 in line with the following bilinear equation that is based on (9), (13), and (14) [23], [9] …”
Section: B Open-ended Coaxial Probe (Oc)mentioning
confidence: 99%
“…Accordingly, the same equation containing two Cole-Cole terms and a direct current (DC) conductivity term is also used to characterize the spectra Fig. 4 shows the curve fitting by using (23) on the measured dielectric spectra of compacted kaolin with w=20.5%. The discrepancy between the total fit and the experimental data at the low frequency tail in the r ε ′ -spectrum (see Fig.…”
Section: A Modified Compacted Kaolinmentioning
confidence: 99%
“…Another issue of this technique concerns the probe calibration, which is usually carried out in three steps with factory-standard calibration loads (short, open and load terminations) (Blackham and Pollard (1997)). In order to improve the accuracy of the measurement, reference loads with liquids of known permittivity (Marsland and Evans (1987)) or short-cavitiy terminations (Otto and Chew (1991)) have been proposed.…”
Section: One-port Techniques 211 Open-ended Coaxial Probementioning
confidence: 99%
“…Various microwave techniques have been introduced in literature to characterize the electrical properties of materials. They include open-ended waveguide/coaxial probe methods [18], free-space techniques [16], stripline [20], transmission/reflection [4] and resonant [22] procedures, all having specific advantages and constraints. Among them, open resonator methods [10,11,13,15,17,25] give the most powerful tool to accurately retrieve the equivalent impedance properties of low-loss thin dielectric surfaces.…”
Section: Introductionmentioning
confidence: 99%