The microstructures of typical commercial X7R MLCCs were characterized by transmission electron microscopy (TEM), using tripod polished specimens and ion milled samples. Core-shell structures were clearly observed in the TEM specimens, and glass phases located at the grain boundaries and triple points were frequently observed. Their chemical composition was analyzed using energy dispersive X-ray spectrometry (EDS), which showed bismuth ions diffused into the shell regions, while the cores were pure BaTiO 3 . X-ray diffraction (XRD) suggested that the predominant phase in the microstructure had pseudocubic global symmetry, while ferroelectric domains were observed in TEM bright field (BF) images. The internal electrodes in the devices were an alloy of Ag/Pd, and these regions were found to have twinned crystal structures. The stress states in the interfaces between the electrodes and the dielectric layers were revealed, and no silver migration in the flux at the electrode-dielectric interfaces was observed.