Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications

Mazierska, J.

doi:10.1007/bf02763176

Cited by 68 publications

(40 citation statements)

References 27 publications

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“…[14][15][16][17] Krupka et al reported the use of shielded end post dielectric resonators for characterization of ultrathin metal films, including graphene, 18 and discussed the different regimes of conductivity with respect to the resonator response. 19 In our recent contribution, the sheet resistance of a variety of graphene layers on 10 Â 10 mm 2 substrates was determined from the measured quality factor of a closed microwave cavity loaded with a sapphire dielectric puck and the sample under test.…”

Section: Introductionmentioning

confidence: 99%

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Shaforost

Wang

Goniszewski

et al. 2015

Journal of Applied Physics

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A method for contact-free determination of the sheet resistance of large-area and arbitrary shaped wafers or sheets coated with graphene and other (semi) conducting ultrathin layers is described, which is based on an open dielectric loaded microwave cavity. The sample under test is exposed to the evanescent resonant field outside the cavity. A comparison with a closed cavity configuration revealed that radiation losses have no significant influence of the experimental results. Moreover, the microwave sheet resistance results show good agreement with the dc conductivity determined by four-probe van der Pauw measurements on a set of CVD samples transferred on quartz. As an example of a practical application, correlations between the sheet resistance and deposition conditions for CVD graphene transferred on quartz wafers are described. Our method has a high potential as measurement standard for contact-free sheet resistance measurement and mapping of large area graphene samples.

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Section: Introductionmentioning

confidence: 99%

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Shaforost

Wang

Goniszewski

et al. 2015

Journal of Applied Physics

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“…The resonator is then placed inside a small cavity made of oxygen free high-conductivity copper (OFHC) which is gold (purity [99.9 %) plated to minimize the radiation loss. The details of this device are well described in some references [15][16][17][18][19][20] [10][11][12][13][14]. The ceramic was sintered by traditional powder processing method [1][2][3].…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…The sharp peaks in S 21 or S 12 diagram correspond to the resonant modes. These modes can be distinguished from the cavity modes easily by observing the shift of resonate frequency [15][16][17] with the change of temperature, while the cavity modes do not shift obviously.…”

Section: Theoretical Principle and Experiments Methodsmentioning

confidence: 99%

“…Superconducting parallel plate resonator (PPR), a parallel plate capacitor structure with two superconducting films back to back and a dielectric spacer between them was first introduced by Taber [15] to measure the RF surface resistance of superconductor films. This method was then extensively utilized in research studies [16][17][18][19][20][21][22]. In this manuscript, we, in another point of view, will demonstrate that this device can also be used to measure microwave loss tangent of any dielectric materials at cryogenic temperature range with great advantages over the commonly used TE 01d metal cavity method [1,2].…”

Section: Introductionmentioning

confidence: 96%

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Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Zhang

Wang

2015

J Theor Appl Phys

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We demonstrate that the superconducting film resonator can be used to accurately and quantitatively measure the microwave dielectric loss tangent of a variety of materials. Compared to traditional dielectric resonator loaded metal cavity method, it has advantage of small sample size (*2-3 orders of magnitude smaller than the old method), and much higher sensitivity to measure small loss tangent values as small as 10 -5 at around 7 GHz band at cryogenic temperatures. This method can be utilized widely in study of mechanism of microwave loss at cryogenic temperature range, which is extremely important in superconducting microwave application areas, such as novel super quantum computers.

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“…5,6 Another important and separate task for this purpose is the development of simple and highly sensitive testing techniques for characterization of superconducting thin films and small sample volume crystals for various applications. [7][8][9][10][11][12][13][14][15] Hence, the development of a novel and sensitive testing method for the measurement, in particular, is of primary importance at present. Here we report the measurement technique of the magnetic penetration depth, (H,T), which allows us to study the peculiarities of vortex dynamics in thin plate-like high-T c cuprates with high resolution.…”

Section: Introductionmentioning

confidence: 99%

Highly sensitive open-flat coil magnetometer for the λ(H,T) measurements in plate-like high-Tc cuprates

Gevorgyan

Kiss

Movsisyan

et al. 2000

Review of Scientific Instruments

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The “LC resonator” method was greatly improved for high resolution measurements of magnetic-field penetration depth, λ, of radio frequency into thin films or plate-like high-Tc superconductors by replacing a solenoid testing coil by an open-flat coil (OFC) driven by a tunnel diode oscillator of a low power and a highly stable frequency. The assembled OFC magnetometer showed new technical advantages such as simplicity, convenience, and high resolution of Δλ∼1–3 Å (Δλ/λ∼10−6), ability of reliable operation in wide ranges of temperature (4.2–300 K) and magnetic field (up to 12 T), etc. This enables us to use it for studying peculiarities of the vortex dynamics with weak signal in small sample volume high-Tc cuprates. As a first test of the assembled 23 MHz measuring setup, the temperature dependence of the upper critical field, HC2(T), is determined from the magnetic transition curves at different temperatures for Y1Ba2Cu3O7−δ thin-film ring. The HC2(T) data obey the formula: [1−(T/Tc)2]β with β=1.22±0.03 at temperatures close to Tc. The methods to increase the resolution of the OFC magnetometer by several orders of magnitude are suggested. It is believed to be feasible to reach the level of detection of the suppression of superconductivity in samples of size of a few micrometers by penetration of a few flux quanta by decreasing the size of the open-flat coil.

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Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications

Cited by 68 publications

References 27 publications

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Contact-free sheet resistance determination of large area graphene layers by an open dielectric loaded microwave cavity

Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Highly sensitive open-flat coil magnetometer for the λ(H,T) measurements in plate-like high-Tc cuprates

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