“…Thus, other complementary techniques started being utilized, such as optical microcopy [ 41 , 56 ], X-ray diffraction (XRD) [ 36 ] and Fourier-Transform Infrared spectroscopy (FTIR) [ 48 ], allowing more precise and realistic phase diagrams to be developed. The improvement of the measuring devices also allows the management and reporting of additional data, which enables, for example, the representation of Tammann plots [ 26 , 32 , 34 , 35 , 42 , 43 , 47 , 49 , 50 , 52 , 54 , 55 , 56 ].…”