2019
DOI: 10.1038/s41563-019-0387-3
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Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin films

Abstract: The properties of organic solids depend on their structure and morphology, yet direct imaging using conventional electron microscopy methods is hampered by the complex internal structure of these materials and their sensitivity to electron beams. Here we managed to observe the nanocrystalline structure of two organic molecular thin film systems using transmission electron microscopy (TEM) by employing a scanning nanodiffraction method that allows for full access to reciprocal space over the size of a spatially… Show more

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Cited by 131 publications
(132 citation statements)
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“…X-ray nanoimaging and transmission electron microscopy (TEM) methods are poorly suited to molecular materials due to low-scattering cross-sections and low damage threshold. Even specialized low-dose imaging has yet been unable to distinguish adjacent amorphous and crystalline phases (52). While previous studies using TEM and far-field spectroscopy had assigned broad spectral features to isolated RuOEP with the P3HT matrix (31), we instead observed, using vibrational exciton nanospectroscopy, the coexistence of amorphous and crystalline phases, with domains as small as a few molecules.…”
Section: Discussioncontrasting
confidence: 57%
“…X-ray nanoimaging and transmission electron microscopy (TEM) methods are poorly suited to molecular materials due to low-scattering cross-sections and low damage threshold. Even specialized low-dose imaging has yet been unable to distinguish adjacent amorphous and crystalline phases (52). While previous studies using TEM and far-field spectroscopy had assigned broad spectral features to isolated RuOEP with the P3HT matrix (31), we instead observed, using vibrational exciton nanospectroscopy, the coexistence of amorphous and crystalline phases, with domains as small as a few molecules.…”
Section: Discussioncontrasting
confidence: 57%
“…SED has recently been applied to characterize correlated defects, for example, using the symmetry within individual convergent beam diffraction disks to map domains in relaxor ferroelectrics 31 and superlattice reflections as signatures of correlated disorder in meteorites. 32 Further, SED has been applied to beam sensitive materials revealing crystallinity in organic molecular crystals 33 , polymers 34 and MOFs. 35,36 Here, we apply SED to directly visualize nanoscale defect domains in UiO-66(Hf).…”
Section: Sed Is a Four-dimensional Scanning Transmission Electron Micmentioning
confidence: 99%
“…We are cu quantify the increase in rec achieved for beam-sensitive s sented in this paper, we are co may enable 3D reconstruction of magnetic fields, 57-59 atomic potentials, 57 or orientational order in molecular liquid crystals and organic semiconductors. 58 The ability of pixelated detectors to record a full diffraction pattern at every probe position (leading to a five-dimensional data set) means strain fields, local crystalline order, and topological defects such as dislocations can be far more easily reconstructed in three dimensions, without requiring prior knowledge of where to sample in reciprocal space.…”
Section: Going Forwardmentioning
confidence: 99%