Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials

Álvarez-Murga, Michelle; Bleuet, Pierre; Hodeau, Jean-Louis

doi:10.1107/s0021889812041039

Cited by 53 publications

(45 citation statements)

References 62 publications

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“…176 It has been applied recently with a reasonable speed (acquisition of a slice in 20 min) for the study of structural change during high temperature modification of catalysts. 177 Alvarez-Murga et al 178 reviewed some recent results on diffraction/scattering computed tomography. They showed that the method yields an enhancement in the detection of the weak signals coming from minor phases.…”

Section: Chemical Tomographymentioning

confidence: 99%

Quantitative X-ray tomography

Maire¹,

Withers²

2013

International Materials Reviews

1,086

601

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X-ray computer tomography (CT) is fast becoming an accepted tool within the materials science community for the acquisition of 3D images. Here the authors review the current state of the art as CT transforms from a qualitative diagnostic tool to a quantitative one. Our review considers first the image acquisition process, including the use of iterative reconstruction strategies suited to specific segmentation tasks and emerging methods that provide more insight (e.g. fast and high resolution imaging, crystallite (grain) imaging) than conventional attenuation based tomography. Methods and shortcomings of CT are examined for the quantification of 3D volumetric data to extract key topological parameters such as phase fractions, phase contiguity, and damage levels as well as density variations. As a non-destructive technique, CT is an ideal means of following structural development over time via time lapse sequences of 3D images (sometimes called 3D movies or 4D imaging). This includes information needed to optimise manufacturing processes, for example sintering or solidification, or to highlight the proclivity of specific degradation processes under service conditions, such as intergranular corrosion or fatigue crack growth. Besides the repeated application of static 3D image quantification to track such changes, digital volume correlation (DVC) and particle tracking (PT) methods are enabling the mapping of deformation in 3D over time. Finally the use of CT images is considered as the starting point for numerical modelling based on realistic microstructures, for example to predict flow through porous materials, the crystalline deformation of polycrystalline aggregates or the mechanical properties of composite materials.

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Section: Chemical Tomographymentioning

confidence: 99%

Quantitative X-ray tomography

Maire¹,

Withers²

2013

International Materials Reviews

1,086

601

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“…The RDF can be determined from X-ray and neutron diffraction data [1][2] and has been widely applied to investigate amorphous materials such as organic solids [3], liquids [4] [5], metallic glasses [6], phase-change memory materials [7] and nanoscaled energy storage materials [8] [9]. Jacques et al combined RDF analysis with X-ray diffraction computed tomography (XRD-CT) [10] for spatially resolved RDF analysis of heterogeneous structures, where structural features around tens of micrometers could be resolved [11].…”

Section: Introductionmentioning

confidence: 99%

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses

Wang

Feng

et al. 2016

Ultramicroscopy

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To overcome some of the challenges in characterizing heterogeneous nanostructured amorphous materials, we developed a new TEM method, RDF imaging, combining scanning transmission electron microscopy diffraction mapping with radial distribution function (RDF) analysis followed by hyperspectral analysis, to enable phase analysis and mapping of heterogeneous amorphous structures purely based on their short-and medium range atomic order. We applied this method to an amorphous zirconium oxide and zirconium iron multilayer system, demonstrating an extreme sensitivity of the method to small atomic packing variations. This approach has great potential to understand local structure variations in glassy composite materials and to provide new insights to correlate structure and properties of glasses.

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“…The beam size and the corresponding spatial resolution should be therefore adapted to the grain size of the specimen, fulfilling the requirement that the number of crystallites in the irradiated volume is large. In spite of this constraint remarkable spatial resolutions of the order of 100 nm could be obtained for nanograined materials (Á lvarez-Murga et al, 2012). An interesting application is given by Stock & Almer (2012), by reconstructing the structure of an SiC-monofilament-reinforced Al-matrix composite.…”

mentioning

confidence: 99%

“…Diffraction/scattering computed tomography (DSCT), presented by Á lvarez- Murga et al (2012), also uses a pencil beam which, however, is monochromatic. DSCT is well adapted for differentiating among multi-phase compounds with similar densities and compositions by exploiting their structural and/or microstructural properties.…”

mentioning

confidence: 99%

X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale

Borbély

Kaysser-Pyzalla

2013

J Appl Cryst

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The discovery made in 1912 by Laue, Friedrich and Knipping, as well as the subsequent work by the Braggs, father and son, laid down the basis for one of the most successful experimental methods in the history of science: X-ray diffraction (XRD). The method has been essential to the scientific discoveries of more than 30 Nobel laureates, illustrating its utility and wide dissemination in many scientific disciplines, encompassing physics, chemistry, biology and medicine. In addition, XRD has underpinned many advances in applied sciences, for example, materials science in the fields of alloy development and component testing, as well as engineering sciences, thereby facilitating the contributions of both basic and applied sciences to the welfare of today's society. This has been highlighted by the recent decision of the United Nations to declare 2014 the International Year of Crystallography. Celebrating this achievement, a number of events and publications will review the major work carried out over the past 100 years; during this period XRD has evolved to become a powerful and indispensable tool in all those scientific fields where knowledge of the relations between crystal structure, function and properties plays an essential role. Today new sources and new techniques open new horizons in XRD techniques and science using XRD.As part of the preparations for the International Year of Crystallography, Journal of Applied Crystallography has published a series of articles on novel diffraction methods enabling visualization of the internal structure of crystalline materials from the millimetre down to the nanometre scale. These works, now gathered together into a virtual issue on X-ray diffraction microscopy, summarize recent developments in the nondestructive monitoring of structural and dynamic information from the bulk of materials in three dimensions. It is believed that this coupled information could lead to a deeper understanding of some of the major problems in materials and engineering sciences, such as polycrystal plasticity or damage. The selected articles describe briefly the methods, focusing mainly on applications. Advantages, limits and future prospects of the techniques are also highlighted.A synthesis of the methods developed around the concept of three-dimensional X-ray diffraction is presented in the article by Poulsen (2012): An introduction to threedimensional X-ray diffraction microscopy. A common feature of these methods is the three-dimensional spatial character of the recovered information, usually attained through a tomographic approach. The main aim of the techniques is the complete spatial, dynamic and time-resolved characterization of a material. Resolution requirements, however, impose constraints on the diffraction setup or acquisition time, demanding that the experimentalist find a good compromise between the obtainable spatial, angular and time resolutions and those characteristic for the investigated phenomenon. Selection of a specific method is usually determined by the nature of the ...

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Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials

Cited by 53 publications

References 62 publications

Quantitative X-ray tomography

Quantitative X-ray tomography

Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured glasses

X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale

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