Diffusion induced grain boundary migration (DIGM) has been studied in the Cu(Zn) system using Cu bicrystals with initially symmetrical tilt grain boundaries (GBs) of the <011> {011} type produced by diffusion bonding. The misorientation has been varied systematically over the range from 10.1 to 171.9°. Measurements of the GB velocity showed it to have a strong dependence on the misorientation angle. The morphology of DIGM has been studied by optical microscopy. As a special morphological phenomenon, faceting has been investigated at a symmetrical Σ 19a/26.52° <011> {011} GB