Diffusion processes in the mixing zone of a supersonic jet of low density

Free underexpanded jets in a quiescent medium: A review

“…Thus, one may easily find experimental works [66,144,145,[30][31][32]157,70,134,135,[191][192][193][194][195][196][197][198][199][200][201][202][203][204][205][206][207]148,151,35,77,38,39,15,64,40,142,82,123,159,42,127,59,55,51,87,60,122,150], as well as theoretical ones [133,74,…”

On the formation of an external cluster flow in a supersonic jet

“…The work [20] presented a detailed study of diffusion processes in the mixing zone of a low-density supersonic jet. However, no attention was paid to the influence of all features of the condensation process on this process, since the effect of the formation of a "cluster wake" was discovered much later.…”

<title>Measurement of the local density in rarefied flows by means of characteristic fluorescence</title>

“…Experimental studies of the gasdynamic structure of low-density jets beyond a sonic nozzle at high pressure drops I have shown that in a wide range of parameters, including modes of rarefied flows, the geometrical configuration of the jet and the distributions of the density and total pressure are self-similar when the value of the complex Re L = Re/-sR is constant. [12][13][14] In this expression , N = po/p is the ratio of the stagnation pressure, p to the pressure in ambient space, p When a gas escapes into a medium with a temperature different from the stagnation temperature of the gas of the jet the distribution of the parameters in the mixing zone depends on the temperature drop and on the temperature levels. In this connection it is possible for the temperature factor to affect the structure of the jet as a whole, especially at small values of ReL that correspond to the transition to rarefied flow.…”

“…The electron beam passed through the vacuum chamber and arrived at an aluminium collector (13) with an entrance window of 14 mm diameter. The current of the electron beam was measured by a milliamperemeter (14) included in the collector circuit.…”