2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2018
DOI: 10.1109/ipfa.2018.8452517
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Digital Block Defect Localization using in-depth Circuit Analysis for Electrical Verification and Fault Isolation Correlation

Ronald C. Apolinaria
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David Joseph Rimbon
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,
Em Julius De La Cruz
3
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