Digital metrology of polycrystalline networks of methyl acrylate layers

Abstract

This work is aimed at generalizing the methods of laser polarimetry in the case of partially depolarizing optically anisotropic methyl acrylate layers. A method of differential Mueller-matrix mapping is proposed and substantiated for reproducing the distributions of the parameters of linear and circular birefringence and dichroism of partially depolarizing methyl acrylate layers.