2010 19th IEEE Asian Test Symposium 2010
DOI: 10.1109/ats.2010.55
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Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures

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Cited by 10 publications
(7 citation statements)
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“…However, when a DSP is not available for test application, filtered digital pulse trains produced by logic circuitry can be used as test stimulus [8] for test purposes.…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
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“…However, when a DSP is not available for test application, filtered digital pulse trains produced by logic circuitry can be used as test stimulus [8] for test purposes.…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
“…Optimization algorithms running on the baseband DSP are used to determine perturbations of the tuning knob values that cause the cost metric C to be minimized across multiple testing and tuning iterations. When a DSP is not available, dedicated on-chip circuitry can be used to implement simpler optimization procedures such as the SS-LMS algorithm [8] for tuning purposes. A key benefit here is that data for tuning does not need to be prestored in memory such as for the mapping function described earlier.…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
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“…The sensors extract characteristic device features that are used by the DSP in the regression-based performance prediction for testing [9] or tuning [10] purposes. In a recent work, [8] considers the tuning of RF performances using digital signatures. The Hamming distance between the reference signature and the actual signature is used to control the device, without the need of performance prediction from the observed responses.…”
Section: Related Workmentioning
confidence: 99%