Dimensional artefacts to achieve metrological traceability in advanced manufacturing

Carmignato, Simone; Chiffre, Leonardo De; Bosse, Harald; Leach, Richard; Balsamo, Alessandro; Estler, William T.

doi:10.1016/j.cirp.2020.05.009

Cited by 71 publications

(44 citation statements)

References 201 publications

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“…After measurement, the slip gauges were directly measured by the LCI system within a temperature controlled lab (20°C) in order to minimise the change in step size due to thermal expansion. Thermal expansion can be determined through the use of Equation (5).…”

Section: Methods 2: Step Heightmentioning

confidence: 99%

“…The use of step heights has been extensively used for measurement tool calibration [5], with gauge blocks being one of the most common artefacts [6] due to their range of lengths, materials and availability [7]. Three-dimensional artefacts for areal calibration have also been developed for the determination of surface characteristics and lateral resolution [8,9].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

Hovell

Petzing

Justham

et al. 2021

Sensors

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In-situ metrology utilised for surface topography, texture and form analysis along with quality control processes requires a high-level of reliability. Hence, a traceable method for calibrating the measurement system’s transfer function is required at regular intervals. This paper compares three methods of dimensional calibration for a spectral domain low coherence interferometer using a reference laser interferometer versus two types of single material measure. Additionally, the impact of dataset sparsity is shown along with the effect of using a singular calibration dataset for system performance when operating across different media.

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Section: Methods 2: Step Heightmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

Hovell

Petzing

Justham

et al. 2021

Sensors

View full text Add to dashboard Cite

show abstract

“…The publications of high value for the EMN are located in the upper right-hand quadrant, where the quality is rated highest and the number of mentioned gaps is between 6 and 12. Of the 145 analysed publications, 11 are considered particularly valuable [22][23][24][25][26][27][28][29][30][31][32].…”

Section: Analysis Of Current Research-main Topics and Needsmentioning

confidence: 99%

New European Metrology Network for advanced manufacturing

Przyklenk

Balsamo

O’Connor

et al. 2021

Meas. Sci. Technol.

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Advanced manufacturing has been identified as one of the key enabling technologies with applications in multiple industries. The growing importance of advanced manufacturing is reflected by an increased number of publications on this topic in recent years. Advanced manufacturing requires new and enhanced metrology methods to assure the quality of manufacturing processes and the resulting products. However, a high-level coordination of the metrology community is currently absent in this field and consequently this limits the impact of metrology developments on advanced manufacturing. In this article we introduce the new European Metrology Network (EMN) for Advanced Manufacturing within EURAMET, the European Association of National Metrology Institutes (NMIs). The EMN is intended to be operated sustainably by NMIs and Designated Institutes in close cooperation with stakeholders interested in advanced manufacturing. The objectives of the EMN are to set up a permanent stakeholder dialogue, to develop a Strategic Research Agenda for the metrology input required for advanced manufacturing technologies, to create and maintain a knowledge sharing programme and to implement a web-based service desk for stakeholders. The EMN development is supported by a Joint Network Project within the European Metrology Programme for Innovation and Research.

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“…This information feedback corrects the inspection rules, mechanisms, and action plans to maximize supplier-buyer resource benefits. In this scenario, the ASPs should have manufacturing traceability to accommodate such valuable information [15][16]. However, the basic SSP cannot help practitioners to gain such valuable information.…”

Section: Introductionmentioning

confidence: 99%

An Integrated Supplier-Buyer Lots Sampling Plan With Quality Traceability Based on Process Loss Restricted Consideration

2021

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Supplier-buyer relationships have been the focus of considerable supply chain management and marketing research for decades. To validate the process capability of a supplier, practitioners usually operate the acceptance sampling plan (ASP). The most basic ASP is a single sampling plan (SSP) due to its straightforward lot-disposition mechanism. However, since the lot-disposition mechanism of SSP cannot accommodate the historical lot-quality levels information, it requires a large sample size for inspection to validate the submitted lot's process capability. To obtain these benefits from historical information, multiple-lot dependent state (MDS) sampling plans have been proposed. The MDS plans have manufacturing traceability of historical lot-quality levels information to sentence the submitted lot. However, the MDS plan's manufacturing traceability has a drawback that cost-efficiency decreases as more historical lot-quality levels information are considered, which contradicts its initial development goal. To overturn this contradictory situation, we proposed the adaptive MDS (AMDS) plans based on the process loss restricted consideration with combinatorial mathematical treatment that can correct the MDS plans manufacturing traceability of historical lot-quality levels information that help practitioners to adopt more historical information into lot-disposition freely without bearing the reduction of cost-efficiency. Meanwhile, their performances are superior to existing MDS plans in terms of cost-effectiveness and discriminatory power. Moreover, we further developed a web-based app for our proposed plans to improve the convenience of applying them in practice. By operating the web-based app, practitioners can quickly obtain the optimal plan criteria without bearing the burdens of table-checking or mathematical model solving. These improvements can genuinely help buyers distinguish reliable suppliers efficiently and build up a strong partnership with them. Finally, the applicability of the proposed plan is demonstrated in a realworld case study.INDEX TERMS Lot tracing, process loss restricted, lot-dependent sampling plans, supplier-buyer relationships, historical lot-quality levels information.

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Dimensional artefacts to achieve metrological traceability in advanced manufacturing

Cited by 71 publications

References 201 publications

Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

New European Metrology Network for advanced manufacturing

An Integrated Supplier-Buyer Lots Sampling Plan With Quality Traceability Based on Process Loss Restricted Consideration

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