2015
DOI: 10.1016/j.jmmm.2015.03.075
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Dimensionality crossover in critical behaviour of ultrathin ferromagnetic films

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Cited by 46 publications
(19 citation statements)
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“…This crossover had been observer in behaviour of critical exponent β. It was obtained in paper devoted to the experimental study of the critical behavior of thin films [15] and MC simulation of anisotropic Heisenberg model [16,17]. Dependence of critical exponents z, θ ′ , β/ν from film thickness was obtain.…”
Section: Discussionmentioning
confidence: 99%
“…This crossover had been observer in behaviour of critical exponent β. It was obtained in paper devoted to the experimental study of the critical behavior of thin films [15] and MC simulation of anisotropic Heisenberg model [16,17]. Dependence of critical exponents z, θ ′ , β/ν from film thickness was obtain.…”
Section: Discussionmentioning
confidence: 99%
“…However, for structures with N ≤ 11 and N ≥ 25 the magnetoresistance is characterized by fast falling down practically before null in the same interval of temperatures. Note that the observable changes of the magnetoresistance with increasing thickness of ferromagnetic films N correspond to dimensional changes of the critical temperature of ferromagnetic phase transition in Heisenberg films revealed in papers [16,17] and agree with results of the experimental investigations of dimensional phenomena in the ultrathin films Fe, Co, and Ni on substrates from nonmagnetic metals [1]. In accordance with papers [16,17], the films with thicknesses in interval N = 13 ÷ 20 in which the magnetoresistance takes on a maximal values with very slow temperature falling down correspond to Heisenberg films demonstrating the critical behavior of the 3D Ising model.…”
mentioning
confidence: 81%
“…The Monte Carlo study of dimensional crossover effects in the critical properties of multilayer Heisenberg films have been performed in works [16,17]. For films with different thicknesses it was taken into account the effect of anisotropy generated by the crystal field of the substrate.…”
mentioning
confidence: 99%
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