It is common to test components after they are designed and redesign if necessary. The reduction of the uncertainty in the probability of failure that can occur after a test is usually not incorporated in reliability calculations at the design stage. This reduction in uncertainty is accomplished by additional knowledge provided by the test and by redesign when the test reveals that the component is unsafe or overly conservative. In this paper, a methodology is developed to estimate the effect of a single future thermal test followed by redesign and to model the effect of the resulting reduction of the uncertainty in the probability of failure. Using assumed distributions of computation and experimental errors and given redesign rules, possible outcomes of the future test and redesign through Monte Carlo sampling are obtained to determine what changes in probability of failure, design, and weight will occur. In addition, Bayesian updating is used to gain accurate estimates of the probability of failure after a test. These methods are demonstrated through a future thermal test on an integrated thermal protection system. Performing redesign following a single future test can reduce the probability of failure by orders of magnitude, on average, when the objective of the redesign is to restore original safety margins. Redesign for a given reduced probability of failure allows additional weight reduction. = lower bound for probabilistic redesign criterion P U = upper bound for probabilistic redesign criterion p f;analyst = analyst-estimated probability of failure, % p f;target = probabilistic redesign probability of failure target, % p f;true = true probability of failure, % R = response r = random variable