2018
DOI: 10.1134/s1063782618160273
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Diode Polarization and Resistive Switching in Metal/TlGaSe2 Semiconductor/Metal Devices

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Cited by 6 publications
(16 citation statements)
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“…Memristive (resistive-switching) memory effects have been recently observed by authors in nominally undoped bulk TlGaSe 2 samples [32,33]. Diode-type nonlinear currentvoltage characteristics in metal-TlGaSe 2 -metal structures have been revealed.…”
Section: Introductionmentioning
confidence: 83%
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“…Memristive (resistive-switching) memory effects have been recently observed by authors in nominally undoped bulk TlGaSe 2 samples [32,33]. Diode-type nonlinear currentvoltage characteristics in metal-TlGaSe 2 -metal structures have been revealed.…”
Section: Introductionmentioning
confidence: 83%
“…In these structures, the rectification direction depends only on the polarity of previously applied bias to the electrodes and is independent of the electrode materials. This phenomenon has been understood within the framework of electromigration of charged entities (native Se vacancies or Se ions) leading to the formation of a thin insulator layer near the biased TlGaSe 2 sample surface [32,33].…”
Section: Introductionmentioning
confidence: 99%
“…[ 1–4 ] In bulk form, TlGaSe2 is a p‐type semiconductor with optical bandgap in the visible spectral range (≈2.1 eV) at room temperature. [ 5–9 ] TlGaSe2 grows in the form of multilayers where layers are weakly interacting through van der Waals forces along the [ 001 ] direction. Within the layers, every atom is strongly bonded with neighbor ones via ion‐covalent chemical bonding mechanism.…”
Section: Introductionmentioning
confidence: 99%
“…At room temperature the electronic transport mechanism in the direction parallel to the layers is directly related to the presence of localized states in the bandgap created by native structural defects. [ 7–19 ] The electrical conduction perpendicular to the layers is expected to be highly sensitive to inevitable structural defects such as: planar defects presented between the layers due to a slipping of successive layers, point defects, charged impurities, deep level traps, dislocations as well as to many other crystal lattice imperfections that are mainly attributed to the interlayer stacking faults. [ 20–22 ] Only at extremely high temperatures, due to the thermally activated free carriers from the valence band the intrinsic electrical conduction is determined by a band‐to‐band mechanism.…”
Section: Introductionmentioning
confidence: 99%
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